Scanning force microscope for in situ nanofocused X‐ray diffraction studies. (7th August 2014)

• Record Type: Journal Article
• Authors: Ren, Zhe; Mastropietro, Francesca; Davydok, Anton; Langlais, Simon; Richard, Marie‐Ingrid; Furter, Jean‐Jacques; Thomas, Olivier; Dupraz, Maxime; Verdier, Marc; Beutier, Guillaume; Boesecke, Peter; Cornelius, Thomas W.
• Is Part Of: Journal of synchrotron radiation. Volume 21:Part 5(2014)
• Page Start: 1128
• Page End: 1133
• Publication Date: 2014-08-07
• Subjects: Synchrotron radiation -- Periodicals; Free electron lasers -- Periodicals; 539.73505
• DOI: 10.1107/S1600577514014532
• Languages: English
• ISSNs: 0909-0495

Abstract

<abstract abstract-type="main" xml:lang="en"> <title> <x xml:space="preserve">Abstract</x> </title> <p>A compact scanning force microscope has been developed for <italic>in situ</italic> combination with nanofocused X‐ray diffraction techniques at third‐generation synchrotron beamlines. Its capabilities are demonstrated on Au nano‐islands grown on a sapphire substrate. The new <italic>in situ</italic> device allows for <italic>in situ</italic> imaging the sample topography and the crystallinity by recording simultaneously an atomic force microscope (AFM) image and a scanning X‐ray diffraction map of the same area. Moreover, a selected Au island can be mechanically deformed using the AFM tip while monitoring the deformation of the atomic lattice by nanofocused X‐ray diffraction. This <italic>in situ</italic> approach gives access to the mechanical behavior of nanomaterials.</p> </abstract>