Cite
MLA Citation
Jendrik Stein et al.. “Aging‐time‐resolved in situ microstructural investigation of tin films electroplated on copper substrates, applying two‐dimensional‐detector X‐ray diffraction.” Journal of applied crystallography, vol. 46, n.d., pp. 1645–1653. http://access.bl.uk/ark:/81055/vdc_100024580960.0x00004f