Cite
HARVARD Citation
Sengupta, A. et al. (eds.) (2019) VLSI design and test : 23rd International Symposium, VDAT 2019, Indore, India, July 4-6, 2019, Revised selected papers. [Online]. Singapore : Springer. Available from: http://access.bl.uk/ark:/81055/vdc_100086819604.0x000001