VLSI design and test : 23rd International Symposium, VDAT 2019, Indore, India, July 4-6, 2019, Revised selected papers /: 23rd International Symposium, VDAT 2019, Indore, India, July 4-6, 2019, Revised selected papers. (2019)

• Record Type: Book
• Other Titles: VDAT 2019
• Further Information: Note: Anirban Sengupta, Sudeb Dasgupta, Virendra Singh, Rohit Sharma, Santosh Kumar Vishvakarma (eds.).
• Editors: Sengupta, Anirban; Dasgupta, Sudeb; (Associate professor of electrical engineering), Singh, Virendra; Sharma, Rohit (Rohit Y.); Vishvakarma, Santosh Kumar
• Other Names: VDAT (Symposium), 23rd
• Contents: Analog and Mixed Signal Design.- Computing Architecture and Security.- Hardware Design and Optimization.- Low Power VLSI and Memory Design. -Device Modelling.- Hardware Implementation.
• Publisher Details: Singapore : Springer
• Publication Date: 2019
• Extent: 1 online resource (xvi, 775 pages), illustrations (some color)
• Subjects: 621.39/5; Integrated circuits -- Very large scale integration -- Testing -- Congresses; Integrated circuits -- Very large scale integration -- Design and construction -- Congresses; Electronic books
• Languages: English
• ISBNs: 9789813297678; 9813297670
• Related ISBNs: 9789813297661
• Notes: Note: Online resource; title from PDF title page (SpringerLink, viewed September 6, 2019).
• Access Rights: Legal Deposit; Only available on premises controlled by the deposit library and to one user at any one time; The Legal Deposit Libraries (Non-Print Works) Regulations (UK).
• Access Usage: Restricted: Printing from this resource is governed by The Legal Deposit Libraries (Non-Print Works) Regulations (UK) and UK copyright law currently in force.