Cite
MLA Citation
O (Otwin) Breitenstein et al.. Lock-in thermography : basics and use for evaluating electronic devices and materials. Cham, Switzerland : Springer, 2018. http://access.bl.uk/ark:/81055/vdc_100074891506.0x000001
This is an interim version of our Electronic Legal Deposit Catalogue-eJournals and eBooks while we continue to recover from a cyber-attack.
O (Otwin) Breitenstein et al.. Lock-in thermography : basics and use for evaluating electronic devices and materials. Cham, Switzerland : Springer, 2018. http://access.bl.uk/ark:/81055/vdc_100074891506.0x000001