Lock-in thermography : basics and use for evaluating electronic devices and materials /: basics and use for evaluating electronic devices and materials. ([2018])

• Record Type: Book
• Further Information: Note: O. Breitenstein, Wilhelm Warta, Martin C. Langenkamp.
• Authors: Breitenstein, O (Otwin); Warta, W (Wilhelm); Langenkamp, M (Martin), 1964-
• Contents: 1. Introduction 2. Physical and Technical Basics 2.1 IR Thermography Basics 2.2 The Lock-in Principle and its Digital Realization 2.3 Lock-in Thermography 2.4 Timing Strategies 2.5 Influence of Non-Harmonic Heating 2.6 Noise Analysis 2.7. Calibration 2.8 Heat Dissipation and Transport Mechanisms in Solar Cells 2.9 Carrier Density Imaging 3. Experimental Technique 3.1 Different (Lock-in) Thermography Realizations 3.2 Commercial Lock-in Thermography Systems 3.3 Illumination Systems 3.4 Solid Immersion Lenses 3.5. Realization of CDI/ILM Systems 3.5.1. Absorption Mode 3.5.2. Emission Mode 3.5.3. Lifetime Calibration 4. Theory 4.1 Influence of the Heat Conduction to the Surrounding 4.2 Temperature Drift Compensation 4.3 Thermal Waves of Point Sources 4.4 Thermal Waves of Extended Sources 4.5 The Quantitative Interpretation of Lock-in Thermograms 4.5.1 The Image Integration / Proportionality Method 4.5.2 Deconvolution of Lock-in Thermograms 5. Measurement Strategies 5.1 Which Signal Should be Displayed? 5.2 Influence of the Lock-in Frequency 5.3 Influence of the IR Emissivity 5.4 Influence of the Peltier Effect 6. Typical Applications 6.1 Integrated Circuits 6.1.1 3D Analysis 6.1.2 IC-Tester Controlled LIT 6.2 Solar Cells 6.2.1 Dark Lock-in Thermography (DLIT) 6.2.1.1 Shunt Imaging 6.2.1.2 High-current DLIT 6.2.1.3 Series Resistance Imaging (RESI) 6.2.1.4 Ideality Factor and Saturation Current Mapping 6.2.1.5 Local I-V curves measured Thermally (LIVT) 6.2.1.6 Reverse-bias DLIT 6.2.1.7 Temperature Coefficient and Slope Imaging 6.2.1.8 DLIT-based Jsc Imaging 6.2.1.9 Local I-V Evaluation 6.2.1.10 LIT and Luminescence Imaging: Comprehensive Loss Analysis 6.2.2 Illuminated Lock-in Thermography (ILIT) 6.2.2.1 Voc-ILIT 6.2.2.2 Jsc-ILIT 6.2.2.3 Rs-ILIT 6.2.2.4 Avalanche Multiplication Factor Imaging (MF-ILIT) 6.2.2.5 ILIT-Based Efficiency Imaging 6.2.2.6 ILIT-Based Jsc Imaging 6.2.2.7 Suns ILIT 6.2.3 Summary of Solar Cell Applications 6.3 Failure Analysis of Solar Modules 6.3.1 Differential ILIT Techniques 6.3.2 Solar Cell Analysis in Modules (SCAM) 6.4 Spin Caloritronics 6.5 CDI/ILM on Solar Materials 6.5.1 Analysis of Material Evaluation During Processing 6.5.1 Temperature-Dependent Measurements 6.5.3 Trap Density Images from CDI/ILM 7. Summary and Outlook References Appendix: Thermal and IR Properties of Selected Materials List of Symbols Abbreviations Index.
• Edition: Third edition
• Publisher Details: Cham, Switzerland : Springer
• Publication Date: 2018
• Copyright Date: 2018
• Extent: 1 online resource, illustrations (some color)
• Subjects: 621.381548; Electronic apparatus and appliances -- Thermal properties; Electronic apparatus and appliances -- Testing; Semiconductors -- Thermal properties; Thermography; TECHNOLOGY & ENGINEERING / Mechanical; Electronic books
• Languages: English
• ISBNs: 9783319998251; 3319998250
• Related ISBNs: 9783319998244
• Notes: Note: Includes bibliographical references and index.; Note: Online resource; title from PDF title page (EBSCO, viewed Jan 14, 2019).
• Access Rights: Legal Deposit; Only available on premises controlled by the deposit library and to one user at any one time; The Legal Deposit Libraries (Non-Print Works) Regulations (UK).
• Access Usage: Restricted: Printing from this resource is governed by The Legal Deposit Libraries (Non-Print Works) Regulations (UK) and UK copyright law currently in force.