Cite
APA Citation
Goldstein, J., Newbury, D. E., Michael, J. R., Ritchie, N. W. M., Scott, J. H. J., & Joy, D. C. (2018). Scanning electron microscopy and x-ray microanalysis. New York, NY : Springer. http://access.bl.uk/ark:/81055/vdc_100069935884.0x000001