Scanning electron microscopy and x-ray microanalysis. (2018)

• Record Type: Book
• Further Information: Note: Joseph I. Goldstein, Dale E. Newbury, Joseph R. Michael, Nicholas W.M. Ritchie, John Henry J. Scott, David C. Joy.
• Authors: Goldstein, Joseph, 1939-; Newbury, Dale E; Michael, Joseph R; Ritchie, Nicholas W. M; Scott, John Henry J; Joy, David C, 1943-
• Contents: Preface -- Scanning Electron Microscopy and Associated Techniques: Overview -- Electron Beam -- Specimen Interactions: Interaction Volume -- Backscattered Electrons -- Secondary Electrons -- X-rays -- SEM Instrumentation -- Image Formation -- SEM Image Interpretation -- The Visibility of Features in SEM Images -- Image Defects -- High resolution imaging -- Low Beam Energy SEM -- Variable Pressure Scanning Electron Microscopy (VPSEM) -- ImageJ and Fiji -- SEM Imaging checklist -- SEM Case Studies -- Energy Dispersive X-ray Spectrometry: Physical Principles and User-Selected Parameters -- DTSA-II EDS Software -- Qualitative Elemental Analysis by Energy Dispersive X-ray Spectrometry -- Quantitative Analysis: from k-ratio to Composition -- Quantitative analysis: the SEM/EDS elemental microanalysis k-ratio procedure for bulk specimens, step-by-step -- Trace Analysis by SEM/EDS -- Low Beam Energy X-ray Microanalysis -- Analysis of Specimens with Special Geometry: Irregular Bulk Objects and Particles -- Compositional Mapping -- Attempting Electron-Excited X-ray Microanalysis in the Variable Pressure Scanning Electron Microscope (VP-SEM) -- Energy Dispersive X-ray Microanalysis Checklist -- X-ray Microanalysis Case Studies -- Cathodoluminescence -- Characterizing crystalline materials in the SEM -- Focused Ion Beam Applications in the SEM laboratory -- Ion Beam Microscopy -- Appendix -- A Database of Electron-Solid Interactions -- Index.
• Edition: Fourth edition
• Publisher Details: New York, NY : Springer
• Publication Date: 2018
• Extent: 1 online resource (xxiii, 550 pages), illustrations (some color)
• Subjects: 502.8/25; Materials science; Scanning electron microscopy; Surfaces (Physics); Microscopy; Spectroscopy; Scanning electron microscopy; Science -- Spectroscopy & Spectrum Analysis; Science -- Life Sciences -- General; Science -- Weights & Measures; Spectrum analysis, spectrochemistry, mass spectrometry; Biology, life sciences; Mensuration & systems of measurement; Technology & Engineering -- Material Science; Testing of materials; Materials Science; Characterization and Evaluation of Materials; Spectroscopy and Microscopy; Biological Microscopy; Spectroscopy/Spectrometry; Measurement Science and Instrumentation; Electronic books
• Languages: English
• ISBNs: 9781493966769; 1493966766
• Related ISBNs: 9781493966745; 149396674X
• Notes: Note: Includes bibliographical references and index.; Note: Online resource; title from PDF title page (SpringerLink, viewed November 29, 2017).
• Access Rights: Legal Deposit; Only available on premises controlled by the deposit library and to one user at any one time; The Legal Deposit Libraries (Non-Print Works) Regulations (UK).
• Access Usage: Restricted: Printing from this resource is governed by The Legal Deposit Libraries (Non-Print Works) Regulations (UK) and UK copyright law currently in force.