Cite
APA Citation
Chattopadhyay, S. (2018). Thermal-aware testing of digital VLSI circuits and systems. Boca Raton : CRC Press. http://access.bl.uk/ark:/81055/vdc_100061935533.0x000001
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Chattopadhyay, S. (2018). Thermal-aware testing of digital VLSI circuits and systems. Boca Raton : CRC Press. http://access.bl.uk/ark:/81055/vdc_100061935533.0x000001