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MLA Citation
Zhiyong Ma et al., editors. Metrology and diagnostic techniques for nanoelectronics. Singapore : Pan Stanford Publishing, 2017. http://access.bl.uk/ark:/81055/vdc_100042251429.0x000001
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Zhiyong Ma et al., editors. Metrology and diagnostic techniques for nanoelectronics. Singapore : Pan Stanford Publishing, 2017. http://access.bl.uk/ark:/81055/vdc_100042251429.0x000001