Cite
MLA Citation
Alan S Kaufman et al.. Intelligent testing with the WISC-V. Hoboken, New Jersey : John Wiley & Sons, Inc, 2015. http://access.bl.uk/ark:/81055/vdc_100027542441.0x000001
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Alan S Kaufman et al.. Intelligent testing with the WISC-V. Hoboken, New Jersey : John Wiley & Sons, Inc, 2015. http://access.bl.uk/ark:/81055/vdc_100027542441.0x000001