1. Characterization of semiconductor heterostructures and nanostructures. (2011) Other Names: Lamberti, Carlo Record Type: Book Extent: 1 online resource (496 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. On-wafer calibration techniques enabling accurate characterization of high-performance silicon devices at the mm-wave range and beyond. (2022) Authors: Rumiantsev, Andrej Record Type: Book Extent: 1 online resource, illustrations View Content: Available online (eLD content is only available in our Reading Rooms) ↗
3. Physics and Technology of Crystalline Oxide Semiconductor CAAC-IGZO : Application to Displays /: Application to Displays. (2016) Editors: Yamazaki, Shunpei; Tsutsui, Tetsuo Record Type: Book Extent: 1 online resource (432 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
4. Physics and technology of crystalline oxide semiconductor CAAC-IGZO : application to LSI /: application to LSI. (2016) Authors: Yamazaki, Shunpei, 1942-; Fujita, Masahiro, 1956- Record Type: Book Extent: 1 online resource View Content: Available online (eLD content is only available in our Reading Rooms) ↗
5. Physics and technology of crystalline oxide semiconductor CAAC-IGZO : fundamentals /: fundamentals. (2016) Authors: Yamazaki, Shunpei, 1942-; Kimizuka, Noboru, 1940- Record Type: Book Extent: 1 online resource View Content: Available online (eLD content is only available in our Reading Rooms) ↗