On-wafer calibration techniques enabling accurate characterization of high-performance silicon devices at the mm-wave range and beyond. (2022)

Record Type:
Book
Title:
On-wafer calibration techniques enabling accurate characterization of high-performance silicon devices at the mm-wave range and beyond. (2022)
Main Title:
On-wafer calibration techniques enabling accurate characterization of high-performance silicon devices at the mm-wave range and beyond
Further Information:
Note: Andrej Rumiantsev.
Authors:
Rumiantsev, Andrej
Contents:
Preface List of Figures List of Tables List of Abbreviations PART I: Development and Implementation Bibliography PART II: Attachments Index About the Author
Edition:
1st
Publisher Details:
Gistrup : River Publishers
Publication Date:
2022
Extent:
1 online resource, illustrations
Subjects:
621.38152
Semiconductors -- Characterization
Languages:
English
ISBNs:
9781000796391
Related ISBNs:
9781000792850
Notes:
Note: Description based on CIP data; resource not viewed.
Access Rights:
Legal Deposit; Only available on premises controlled by the deposit library and to one user at any one time; The Legal Deposit Libraries (Non-Print Works) Regulations (UK).
Access Usage:
Restricted: Printing from this resource is governed by The Legal Deposit Libraries (Non-Print Works) Regulations (UK) and UK copyright law currently in force.
View Content:
Available online (eLD content is only available in our Reading Rooms) ↗
Physical Locations:
British Library HMNTS - ELD.DS.728198
Ingest File:
14_052.xml