71. A dynamic partial reconfiguration design flow for permanent faults mitigation in FPGAs. (April 2018) Authors: Martins, Victor Manuel Gonçalves; Villa, Paulo Ricardo Cechelero; Travessini, Rodrigo; Berejuck, Marcelo Daniel; Bezerra, Eduardo Augusto Journal: Microelectronics and reliability Issue: Volume 83(2018) Page Start: 50 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
72. A fast and flexible HW/SW co-processing framework for Time-of-Flight 3D imaging. (February 2018) Authors: Druml, Norbert; Ehrenhoefer, Christoph; Bell, Walter; Gailer, Christian; Plank, Hannes; Herndl, Thomas; Holweg, Gerald Journal: Microelectronics and reliability Issue: Volume 81(2018) Page Start: 64 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
73. A fast Binary Decision Diagram (BDD)-based reversible logic optimization engine driven by recent meta-heuristic reordering algorithms. (August 2021) Authors: Abdalhaq, Baker; Awad, Ahmed; Hawash, Amjad Journal: Microelectronics and reliability Issue: Volume 123(2021) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
74. A fast decomposition algorithm of positive and negative sequence components with sampling noise optimization. (November 2022) Authors: Ma, Mingyao; Liang, Jiacheng; Xiang, Nianwen; Wang, Hanyu; Wu, Jijun Journal: Microelectronics and reliability Issue: Volume 138(2022) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
75. A fast fault injection platform of multiple SEUs for SRAM-based FPGAs. (March 2018) Authors: Zhang, Rongsheng; Xiao, Liyi; Li, Jie; Cao, Xuebing; Qi, Chunhua; Li, Jiaqiang; Wang, Mingjiang Journal: Microelectronics and reliability Issue: Volume 82(2018) Page Start: 147 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
76. A fast simulation method for analysis of SEE in VLSI. (May 2021) Authors: Lu, Yufan; Chen, Xin; Zhai, Xiaojun; Saha, Sangeet; Ehsan, Shoaib; Su, Jinya; McDonald-Maier, Klaus Journal: Microelectronics and reliability Issue: Volume 120(2021) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
77. A fault detection strategy using the enhancement ensemble empirical mode decomposition and random decrement technique. (August 2017) Authors: Xiang, Jiawei; Zhong, Yongteng Journal: Microelectronics and reliability Issue: Volume 75(2017) Page Start: 317 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
78. A fault tolerant switched reluctance motor drive for electric vehicles under multi-switches open-fault conditions. (November 2020) Authors: Yang, Qingqing; Wang, Rui; Ma, Mingyao; Yang, Shuying; Zhang, Xing Journal: Microelectronics and reliability Issue: Volume 114(2020) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
79. A fault-tolerant control strategy for switched reluctance motor drive for electric vehicles under short-fault condition. (September 2018) Authors: Ma, Mingyao; Wang, Rui; Li, Fei; Wang, Jianing; Yang, Shuying Journal: Microelectronics and reliability Issue: Volume 88/90(2018) Page Start: 1221 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
80. A fault-tolerant reconfiguration system based on pilot switch for grid-connected inverters. (April 2022) Authors: Zhao, Ziyi; Wang, Tianzhen; Benbouzid, Mohamed Journal: Microelectronics and reliability Issue: Volume 131(2022) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗