51. Device embedded substrate. Guidelines. Electrical testing Part 2-2, (31st December 2015) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (20 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
52. Digital subsampling phase lock techniques for frequency synthesis and polar transmission. (2019) Authors: Markulic, Nereo; Raczkowski, Kuba; Craninckx, J (Jan); Wambacq, Piet Record Type: Book Extent: 1 online resource (xxiii, 138 pages), illustrations (some color) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
53. Discrete semiconductor devices and integrated circuits. Field-effect transistors Part 8, (15th June 2001) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (72 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
54. Discrete semiconductor devices and integrated circuits. Optoelectronic devices. Blank detail specification for light-emitting diodes (LEDs) for display applications Part 12-3, (15th November 1998) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (16 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
55. Discrete semiconductor devices and integrated circuits. Semiconductor devices. Semiconductor sensors. General and classification Part 14-1, (15th April 2001) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (14 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
56. Discrete semiconductor devices and integrated circuits. Semiconductor devices. Semiconductor sensors. Hall elements Part 14-2, (15th May 2001) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (18 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
57. Electronic components. Long-term storage of electronic semiconductor devices. Die and wafer devices Part 5, (30th April 2017) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (26 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
58. Electronic components. Long-term storage of electronic semiconductor devices. Micro-electromechanical devices Part 7, (28th January 2021) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (26 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
59. Electronics assembly technology. Endurance test methods for solder joint of area array type package surface mount devices Part 4, (30th June 2015) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (48 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
60. Electronics for embedded systems. (2017) Authors: Bindal, Ahmet Record Type: Book Extent: 1 online resource (xiii, 298 pages), illustrations View Content: Available online (eLD content is only available in our Reading Rooms) ↗