Electronic components. Long-term storage of electronic semiconductor devices. Die and wafer devices Part 5, (30th April 2017)

• Record Type: Book
• Authors: British Standards Institution,
• Publisher Details: London : British Standards Institution
• Publication Date: 2017
• Extent: 1 online resource (26 pages)
• Subjects: 602.1841; Storage; Testing conditions; Semiconductor devices; Colour codes; Labels; Terminology; Symbols; Graphic symbols; Electrical measurement; Marking; Letters (symbols); Ratings; Identification methods; Electric terminals; Position; Electrical testing; Measurement; Electronic equipment and components; Integrated circuits; Endurance testing; Acceptance (approval); Electrostatics; Sensitivity; Reliability
• Languages: English
• Related ISBNs: 9780580835506
• ISSNs: 3028-6168
• Access Rights: Legal Deposit; Only available on premises controlled by the deposit library and to one user at any one time; The Legal Deposit Libraries (Non-Print Works) Regulations (UK).
• Access Usage: Restricted: Printing from this resource is governed by The Legal Deposit Libraries (Non-Print Works) Regulations (UK) and UK copyright law currently in force.