1. Digital integrated circuits : design-for-test using Simulink and Stateflow /: design-for-test using Simulink and Stateflow. (2018) Authors: Perelroyzen, Evgeni Record Type: Book Extent: 1 online resource View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. Digital integrated circuits : design-for-test using Simulink and Stateflow /: design-for-test using Simulink and Stateflow. (©2007) Other Names: Perelroyzen, Evgeni Record Type: Book Extent: 1 online resource (320 pages), illustrations View Content: Available online (eLD content is only available in our Reading Rooms) ↗
3. Random testing of digital circuits : theory and applications /: theory and applications. (2020) Authors: David, René, 1939- Record Type: Book Extent: 1 online resource View Content: Available online (eLD content is only available in our Reading Rooms) ↗
4. Thermal-aware testing of digital VLSI circuits and systems. (2018) Authors: Chattopadhyay, Santanu Record Type: Book Extent: 1 online resource, illustrations (black and white) View Content: Available online (eLD content is only available in our Reading Rooms) ↗