Random testing of digital circuits : theory and applications /: theory and applications. (2020)

• Record Type: Book
• Further Information: Note: René David.
• Authors: David, René, 1939-
• Contents: Random testing and built-in self-test; models for digital circuits and fault models; basic concepts and test generation methods; performance measurements for a test sequence; basic principles of random testing; random test length for combinational circuits; random test length for sequential circuits; random test length for RAMs; random test length for microprocessors; generation of random test sequences; experimental results; signature analysis; design for random testability; appendices - A - random pattern sources, B - calculation of a probability of complete fault coverage, C - finite Markov chains, D - black-box fault model, E - exact calculation of activities, F - comparing asynchronous and synchronous test, G - proofs of properties 7.1, 7.2 and 12.3, H - microprocessor Motorola 6800, I - pseudorandom testing, J - random testing of delay faults, K - subsequences of required lengths, L - diagnosis from random testing, M - conjecture about multiple faults; exercises; solutions to exercises.
• Edition: 1st
• Publisher Details: Boca Raton : CRC Press
• Publication Date: 2020
• Extent: 1 online resource
• Subjects: 621.3815; Digital integrated circuits -- Testing
• Languages: English
• ISBNs: 9781000146011
• Related ISBNs: 9781000110166; 9781000126426; 9781003064718
• Notes: Note: Description based on CIP data; resource not viewed.
• Access Rights: Legal Deposit; Only available on premises controlled by the deposit library and to one user at any one time; The Legal Deposit Libraries (Non-Print Works) Regulations (UK).
• Access Usage: Restricted: Printing from this resource is governed by The Legal Deposit Libraries (Non-Print Works) Regulations (UK) and UK copyright law currently in force.