1. BS IEC 63182-4 Ed.1.0. Magnetic powder cores. guidelines on dimensions and the limits of surface irregularities. Part 4. Block-cores (26th June 2020) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (10 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. Magnetic powder cores. Guidelines on dimensions and the limits of surface irregularities. General specification Part 1, (29th July 2020) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (20 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
3. Field device tool (FDT) interface specification. Communication implementation for common object model. IEC 61784 CPF 9 Part 51-90, (1st March 2019) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (42 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
4. BS ISO 23170. Surface chemical analysis. Depth profiling. Non-destructive depth profiling of nanoscale heavy metal oxide thin films on Si substrates with medium energy ion scattering. (22nd July 2021) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (32 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
5. Magnetic powder cores. Guidelines on dimensions and the limits of surface irregularities. Cylinder-cores Part 5, (23rd June 2022) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (16 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
6. Magnetic powder cores. Guidelines on dimensions and the limits of surface irregularities. Block-cores Part 4, (23rd June 2022) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (16 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
7. Surface chemical analysis. Depth profiling. Non-destructive depth profiling of nanoscale heavy metal oxide thin films on Si substrates with medium energy ion scattering. (3rd August 2022) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (38 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗