BS ISO 23170. Surface chemical analysis. Depth profiling. Non-destructive depth profiling of nanoscale heavy metal oxide thin films on Si substrates with medium energy ion scattering. (22nd July 2021)

Record Type:
Book
Title:
BS ISO 23170. Surface chemical analysis. Depth profiling. Non-destructive depth profiling of nanoscale heavy metal oxide thin films on Si substrates with medium energy ion scattering. (22nd July 2021)
Main Title:
BS ISO 23170. Surface chemical analysis. Depth profiling. Non-destructive depth profiling of nanoscale heavy metal oxide thin films on Si substrates with medium energy ion scattering.
Authors:
British Standards Institution,
Publisher Details:
London : British Standards Institution
Publication Date:
2021
Extent:
1 online resource (32 pages)
Subjects:
602.1841
Control surfaces
Testing
Chemical methods of analysis
Chemical tests
Laboratories (chemical)
Reactions (chemical)
Languages:
English
ISSNs:
3042-3416
Access Rights:
Legal Deposit; Only available on premises controlled by the deposit library and to one user at any one time; The Legal Deposit Libraries (Non-Print Works) Regulations (UK).
Access Usage:
Restricted: Printing from this resource is governed by The Legal Deposit Libraries (Non-Print Works) Regulations (UK) and UK copyright law currently in force.
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Physical Locations:
British Library HMNTS - ELD.DS.625603
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05_035.xml