Surface chemical analysis. Depth profiling. Non-destructive depth profiling of nanoscale heavy metal oxide thin films on Si substrates with medium energy ion scattering. (3rd August 2022)

Record Type:
Book
Title:
Surface chemical analysis. Depth profiling. Non-destructive depth profiling of nanoscale heavy metal oxide thin films on Si substrates with medium energy ion scattering. (3rd August 2022)
Main Title:
Surface chemical analysis. Depth profiling. Non-destructive depth profiling of nanoscale heavy metal oxide thin films on Si substrates with medium energy ion scattering.
Authors:
British Standards Institution,
Publisher Details:
London : British Standards Institution
Publication Date:
2022
Extent:
1 online resource (38 pages)
Subjects:
602.1841
Control surfaces
Testing
Chemical methods of analysis
Chemical tests
Laboratories (chemical)
Reactions (chemical)
Languages:
English
Related ISBNs:
9780539144734
ISSNs:
3042-3417
Access Rights:
Legal Deposit; Only available on premises controlled by the deposit library and to one user at any one time; The Legal Deposit Libraries (Non-Print Works) Regulations (UK).
Access Usage:
Restricted: Printing from this resource is governed by The Legal Deposit Libraries (Non-Print Works) Regulations (UK) and UK copyright law currently in force.
View Content:
Available online (eLD content is only available in our Reading Rooms) ↗
Physical Locations:
British Library HMNTS - ELD.DS.715358
Ingest File:
14_029.xml