1. Atomic force microscopy in liquid : biological applications /: biological applications. (2012) Editors: Baró, Arturo M; Reifenberger, Ronald G Record Type: Book Extent: 1 online resource (xix, 362 pages), illustrations View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. Imaging and manipulation of adsorbates using dynamic force microscopy : proceedings from the AtMol Conference Series, Nottingham, UK, April 16-17, 2013 /: proceedings from the AtMol Conference Series, Nottingham, UK, April 16-17, 2013. (2015) Editors: Moriarty, Philip, 1968-; Gauthier, Sebastién Other Names: AtMol (Conference) Record Type: Book Extent: 1 online resource (xx, 154 pages), illustrations (some color) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
3. Atomic force microscopy in process engineering : introduction to AFM for improved processes and products /: introduction to AFM for improved processes and products. (©2009) Other Names: Bowen, W. Richard; Hilal, Nidal Record Type: Book Extent: 1 online resource (xvi, 283 pages), illustrations View Content: Available online (eLD content is only available in our Reading Rooms) ↗
4. Noncontact atomic force microscopy. Volume 3 (2015) Editors: Morita, S (Seizo), 1948-; Giessibl, Franz J; Meyer, E (Ernst), 1962-; Wiesendanger, R (Roland), 1961- Record Type: Book Extent: 1 online resource (xxii, 527 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
5. Scanning probe microscopy : atomic force microscopy and scanning tunneling microscopy /: atomic force microscopy and scanning tunneling microscopy. ([2015]) Authors: Voigtländer, Bert Record Type: Book Extent: 1 online resource, illustrations (some color) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
6. Atomic force microscopy in process engineering : introduction to AFM for improved processes and products /: introduction to AFM for improved processes and products. (©2009) Other Names: Bowen, W. Richard; Hilal, Nidal Record Type: Book Extent: 1 online resource (xvi, 283 pages), illustrations View Content: Available online (eLD content is only available in our Reading Rooms) ↗
7. Kelvin probe force microscopy : from single charge detection to device characterization /: from single charge detection to device characterization. ([2018]) Editors: Sadewasser, Sascha; Glatzel, Thilo Record Type: Book Extent: 1 online resource (XXIV, 521 pages), 234 illustrations, 194 illustrations in color View Content: Available online (eLD content is only available in our Reading Rooms) ↗
8. Atomic force microscopy in nanobiology. ([2014]) Editors: Takeyasu, Kunio Record Type: Book Extent: 1 online resource (444 pages), illustrations, tables, photographs View Content: Available online (eLD content is only available in our Reading Rooms) ↗
9. Atomic force microscopy in adhesion studies. (©2005) Other Names: Drelich, J (Jaroslaw); Mittal, K. L, 1945- Record Type: Book Extent: 1 online resource (x, 811 pages), illustrations View Content: Available online (eLD content is only available in our Reading Rooms) ↗
10. Advances in imaging and electron physics. Volume 135 (©2005) Other Names: Hawkes, P. W Record Type: Book Extent: 1 online resource (xv, 347 pages), illustrations View Content: Available online (eLD content is only available in our Reading Rooms) ↗