1. Next generation HALT and HASS : robust design of electronics and systems /: robust design of electronics and systems. (2016) Authors: Gray, Kirk; Paschkewitz, John James Record Type: Book Extent: 1 online resource, illustrations (black and white, and colour) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. Accelerated quality and reliability solutions. (2006) Other Names: Klyatis, Lev M; Klyatis, Eugene L Record Type: Book Extent: 1 online resource (xxv, 489 pages), illustrations View Content: Available online (eLD content is only available in our Reading Rooms) ↗
3. Design and analysis of accelerated tests for mission critical reliability. (2004) Other Names: LuValle, Michael J; Lefevre, Bruce G; Kannan, SriRaman Record Type: Book Extent: 1 online resource (236 pages), illustrations View Content: Available online (eLD content is only available in our Reading Rooms) ↗
4. Accelerated life testing of one-shot devices : data collection and analysis /: data collection and analysis. (2021) Authors: Balakrishnan, N, 1956-; So, Hon Yiu; Ling, Man Ho Record Type: Book Extent: 1 online resource View Content: Available online (eLD content is only available in our Reading Rooms) ↗
5. Trends in development accelerated testing for automotive and aerospace engineering. (2020) Authors: Klyatis, Lev M Record Type: Book Extent: 1 online resource, illustrations View Content: Available online (eLD content is only available in our Reading Rooms) ↗
6. Reliability prediction and testing textbook. (2018) Authors: Klyatis, Lev M; Anderson, Edward, 1945- Record Type: Book Extent: 1 online resource View Content: Available online (eLD content is only available in our Reading Rooms) ↗