Design and analysis of accelerated tests for mission critical reliability. (2004)

• Record Type: Book
• Further Information: Note: By Michael J. LuValle, Bruce G. Lefevre, SriRaman Kannan.
• Other Names: LuValle, Michael J; Lefevre, Bruce G; Kannan, SriRaman
• Contents: Book Cover; Title; Copyright; Preface; Authors; Acknowledgments; Contents; 1 Background; 2 Demarcation Mapping: Initial Design of Accelerated Tests; 3 Interface for Building Kinetic Models; 4 Evanescent Process Mapping; 5 Data Analysis for Failure Time Data; 6 Data Analysis for Degradation Data; References; Appendix: Installing the Software; Index.
• Publisher Details: Boca Raton : Chapman & Hall/CRC
• Publication Date: 2004
• Extent: 1 online resource (236 pages), illustrations
• Subjects: 620/.00452; Accelerated life testing; Reliability (Engineering); Reliability (Engineering); TECHNOLOGY & ENGINEERING -- Quality Control; Accelerated life testing; Reliability (Engineering); Reproducibility of Results; Research Design; Electronic books
• Languages: English
• ISBNs: 9780203492031
• Related ISBNs: 020349203X; 1584884711; 9781584884712
• Notes: Note: Includes bibliographical references (pages 227-229) and index.; Note: Print version record.
• Access Rights: Legal Deposit; Only available on premises controlled by the deposit library and to one user at any one time; The Legal Deposit Libraries (Non-Print Works) Regulations (UK).
• Access Usage: Restricted: Printing from this resource is governed by The Legal Deposit Libraries (Non-Print Works) Regulations (UK) and UK copyright law currently in force.