Next generation HALT and HASS : robust design of electronics and systems /: robust design of electronics and systems. (2016)

Record Type:
Book
Title:
Next generation HALT and HASS : robust design of electronics and systems /: robust design of electronics and systems. (2016)
Main Title:
Next generation HALT and HASS : robust design of electronics and systems
Further Information:
Note: Kirk A. Gray, Accelerated Reliability Solutions, LLC, Colorado, USA, John J. Paschkewitz, Product Assurance Engineering, LLC, Missouri, USA.
Authors:
Gray, Kirk
Paschkewitz, John James
Publisher Details:
Chichester, West Sussex : Wiley
Publication Date:
2016
Extent:
1 online resource, illustrations (black and white, and colour)
Subjects:
621.3810287
Accelerated life testing
Electronic systems -- Design and construction
Electronic systems -- Testing
Languages:
English
ISBNs:
9781118700211
Related ISBNs:
9781118700235
Notes:
Note: Includes bibliographical references and index.
Access Rights:
Legal Deposit; Only available on premises controlled by the deposit library and to one user at any one time; The Legal Deposit Libraries (Non-Print Works) Regulations (UK).
Access Usage:
Restricted: Printing from this resource is governed by The Legal Deposit Libraries (Non-Print Works) Regulations (UK) and UK copyright law currently in force.
View Content:
Available online (eLD content is only available in our Reading Rooms) ↗
Physical Locations:
British Library HMNTS - ELD.DS.49890
Ingest File:
01_040.xml