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- Journal Article2,206
- Surface and interface analysis [remove]2,206
- Volume 45:Number 1(2013:Jan.)153
- Volume 45:Number 10(2013:Oct.)39
- Volume 45:Number 11/12(2013:Nov.)46
- Volume 45:Number 13(2013:Dec.)12
- Volume 45:Number 2(2013:Feb.)13
- Volume 45:Number 3(2013:Mar.)13
- Volume 45:Number 4(2013:Apr.)13
- Volume 45:Number 5(2013:May)10
- Volume 45:Number 6(2013:Jun.)20
- Volume 45:Number 7(2013:Jul.)19
- Watts John F. guestEditor. 167
- Abel Marie‐Laure guestEditor. 141
- Lee, Yeonhee 111
- Watts, John F. 111
- Kang, Hee Jae 107
- Kim, Kyung Joong 106
- Lee, Jae Cheol 106
- Lee, Tae Geol 105
- Moon, DaeWon 105
- Abel, Marie‐Laure 104
- 541.33 2,206
- Surface chemistry -- Periodicals 2,206
- Surfaces (Physics) -- Periodicals 2,206
- Thin films -- Periodicals 2,206
- adsorption -- AES -- elemental bulk standards -- quantitative analysis -- XPS 2
- argon cluster -- depth profiling -- gas cluster sources -- thick films -- ToF‐SIMS 2
- (3‐aminopropyl)triethoxysilane -- (3‐aminopropyl)phosphonic acid -- glutaraldehyde -- layer‐by‐layer deposition -- surface functionalization -- TiO2 nanoparticles 1
- (Cr, Al)N -- protective coating -- surface near region -- XPS -- HPPMS -- HiPIMS 1
- (Cr, Ce)/a‐C:H -- tribological behaviors -- cemented WC 1
- (NH4)2SO4 -- high‐modulus carbon fiber -- multistage anodization -- NH4HCO3 1