3D ToF‐SIMS view of interfacial diffusion between Cr2AlC coating and zircaloy substrate. (21st November 2019)

• Record Type: Journal Article
• Authors: Zhang, Lei; Dai, Chunli; Zhang, Jie
• Other Names: Weng Lu‐Tao guestEditor.
• Is Part Of: Surface and interface analysis. Volume 52:Number 5(2020)
• Page Start: 306
• Page End: 310
• Publication Date: 2019-11-21
• Subjects: 3D SIMS -- ceramic coating -- diffusion -- interface -- ToF‐SIMS -- zircaloy; Surfaces (Physics) -- Periodicals; Surface chemistry -- Periodicals; Thin films -- Periodicals; 541.33
• DOI: 10.1002/sia.6715
• Languages: English
• ISSNs: 0142-2421

Abstract

Abstract : A diffused interface between a ceramic coating and a metallic substrate is expected to signify a more solid bonding. In addition to depth profiling, a novel 3D view and imaging approach based on ToF‐SIMS analysis was developed to investigate the diffused species around the interface. The diffusion of Al species in a Cr2 AlC ceramic coating and Zircaloy substrate system was investigated in both the as‐deposited and postannealed states. In terms of the 3D view and imaging of CsAl + after Gaussian convolution, Al species visibly diffused into the substrate after annealing at 800°C for only 5 minutes compared with that in the as‐deposited sample.