Is Part Of: Microelectronics and reliability. Volume 99(2019) - British Library Electronic Legal Deposit Catalogue-Journal Issues and Articles Search Results

Is Part Of Microelectronics and reliability. Volume 99(2019)

1. A no-reference error-tolerability test technique for videos via edge and extreme-value checking and its hardware implementation. (August 2019)

Authors:: Hsieh, Tong-Yu; Chan, Shang-En; Chen, Chao-Ru; Li, Pao-Chien; Ho, Chi-Hsuan
Journal:: Microelectronics and reliability
Issue:: Volume 99(2019)
Page Start:: 1
Record Type:: Journal Article
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2. A thermally-resilient all-optical network-on-chip. (August 2019)

Authors:: Karimi, Roshanak; Koohi, Somayyeh; Tinati, Melika; Hessabi, Shaahin
Journal:: Microelectronics and reliability
Issue:: Volume 99(2019)
Page Start:: 74
Record Type:: Journal Article
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3. Analytical modeling of random discrete traps induced threshold voltage fluctuations in double-gate MOSFET with HfO2/SiO2 gate dielectric stack. (August 2019)

Authors:: S.R., Sriram; B., Bindu
Journal:: Microelectronics and reliability
Issue:: Volume 99(2019)
Page Start:: 87
Record Type:: Journal Article
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4. Atmospheric neutron single event effect test on Xilinx 28 nm system on chip at CSNS-BL09. (August 2019)

Authors:: Yang, Weitao; Li, Yonghong; Li, Yang; Hu, Zhiliang; Xie, Fei; He, Chaohui; Wang, Songlin; Zhou, Bin; He, Huan; Khan, Waseem; Liang, Tianjiao
Journal:: Microelectronics and reliability
Issue:: Volume 99(2019)
Page Start:: 119
Record Type:: Journal Article
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5. CIRCA: Towards a modular and extensible framework for approximate circuit generation. (August 2019)

Authors:: Witschen, Linus; Awais, Muhammad; Ghasemzadeh Mohammadi, Hassan; Wiersema, Tobias; Platzner, Marco
Journal:: Microelectronics and reliability
Issue:: Volume 99(2019)
Page Start:: 277
Record Type:: Journal Article
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6. Correctable and uncorrectable errors using large scale DRAM DIMMs in replacement network servers. (August 2019)

Authors:: Baeg, Sanghyeon; Qasim, Mirza; Kwon, Junhyeong; Li, Tan; Gupta, Nilay; Wen, Shi-Jie; Kolli, Satyadev
Journal:: Microelectronics and reliability
Issue:: Volume 99(2019)
Page Start:: 104
Record Type:: Journal Article
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7. Degradation of AlInAs/InGaAs/InP quantum cascade lasers due to electrode adhesion failure. (August 2019)

Authors:: Pierścińska, D.; Pierściński, K.; Sobczak, G.; Gutowski, P.; Płuska, M.; Bugajski, M.
Journal:: Microelectronics and reliability
Issue:: Volume 99(2019)
Page Start:: 113
Record Type:: Journal Article
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8. Double parallel barrier height behavior of Au/Poly (linoleic acid)-g-poly (methyl methacrylate) (PLiMMA)/n-Si structure. (August 2019)

Authors:: Gökçen, Muharrem; Taran, Songül
Journal:: Microelectronics and reliability
Issue:: Volume 99(2019)
Page Start:: 132
Record Type:: Journal Article
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9. Editorial Board. (August 2019)

Journal:: Microelectronics and reliability
Issue:: Volume 99(2019)
Page Start:: ii
Record Type:: Journal Article
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10. Effect of copper over-pad metallization on reliability of aluminum wire bonds. (August 2019)

Authors:: Kawashiro, Fumiyoshi; Takao, Kentaro; Kobayashi, Tatsuya; Yoshikawa, Masaaki; Miyake, Eitaro; Endo, Yoshiki; Tonedachi, Tatsuo; Nishikawa, Hiroshi
Journal:: Microelectronics and reliability
Issue:: Volume 99(2019)
Page Start:: 168
Record Type:: Journal Article
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