Is Part Of: Microelectronics and reliability. Volume 81(2018) - British Library Electronic Legal Deposit Catalogue-Journal Issues and Articles Search Results

Is Part Of Microelectronics and reliability. Volume 81(2018)

1. A brief overview of gate oxide defect properties and their relation to MOSFET instabilities and device and circuit time-dependent variability. (February 2018)

Authors:: Kaczer, B.; Franco, J.; Weckx, P.; Roussel, Ph.J.; Putcha, V.; Bury, E.; Simicic, M.; Chasin, A.; Linten, D.; Parvais, B.; Catthoor, F.; Rzepa, G.; Waltl, M.; Grasser, T.
Journal:: Microelectronics and reliability
Issue:: Volume 81(2018)
Page Start:: 186
Record Type:: Journal Article
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2. A comparative analysis of microstructural features, tensile properties and wettability of hypoperitectic and peritectic Sn-Sb solder alloys. (February 2018)

Authors:: Dias, Marcelino; Costa, Thiago A.; Silva, Bismarck L.; Spinelli, José E.; Cheung, Noé; Garcia, Amauri
Journal:: Microelectronics and reliability
Issue:: Volume 81(2018)
Page Start:: 150
Record Type:: Journal Article
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3. A fast and flexible HW/SW co-processing framework for Time-of-Flight 3D imaging. (February 2018)

Authors:: Druml, Norbert; Ehrenhoefer, Christoph; Bell, Walter; Gailer, Christian; Plank, Hannes; Herndl, Thomas; Holweg, Gerald
Journal:: Microelectronics and reliability
Issue:: Volume 81(2018)
Page Start:: 64
Record Type:: Journal Article
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4. A new hermetic sealing method for ceramic package using nanosilver sintering technology. (February 2018)

Authors:: Zhang, Hao; Liu, Yang; Wang, Lingen; Fan, Jiajie; Fan, Xuejun; Sun, Fenglian; Zhang, Guoqi
Journal:: Microelectronics and reliability
Issue:: Volume 81(2018)
Page Start:: 143
Record Type:: Journal Article
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5. A review of NBTI mechanisms and models. (February 2018)

Authors:: Mahapatra, Souvik; Parihar, Narendra
Journal:: Microelectronics and reliability
Issue:: Volume 81(2018)
Page Start:: 127
Record Type:: Journal Article
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6. A review on discoloration and high accelerated testing of optical materials in LED based-products. (February 2018)

Authors:: Yazdan Mehr, M.; Toroghinejad, M.R.; Karimzadeh, F.; van Driel, W.D.; Zhang, G.Q.
Journal:: Microelectronics and reliability
Issue:: Volume 81(2018)
Page Start:: 136
Record Type:: Journal Article
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7. An improved reliability model for Si and GaN power FET. (February 2018)

Authors:: Golan, Gady; Azoulay, Moshe; Avraham, Tsuriel; Kremenetsky, Ilan; Bernstein, Joseph B.
Journal:: Microelectronics and reliability
Issue:: Volume 81(2018)
Page Start:: 77
Record Type:: Journal Article
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8. An improved unscented particle filter approach for lithium-ion battery remaining useful life prediction. (February 2018)

Authors:: Zhang, Heng; Miao, Qiang; Zhang, Xin; Liu, Zhiwen
Journal:: Microelectronics and reliability
Issue:: Volume 81(2018)
Page Start:: 288
Record Type:: Journal Article
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9. Analysis of low isolation problem in HMC using Ishikawa model: A case study. (February 2018)

Authors:: Jayaprasad, G.; Dhanalakshmi, P.P.; Baskaran, M.; Hemachandran, S.
Journal:: Microelectronics and reliability
Issue:: Volume 81(2018)
Page Start:: 195
Record Type:: Journal Article
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10. Bias temperature instabilities in 4H SiC metal oxide semiconductor field effect transistors: Insight provided by electrically detected magnetic resonance. (February 2018)

Authors:: Lenahan, P.M.; Anders, M.A.; Waskiewicz, R.J.; Lelis, A.J.
Journal:: Microelectronics and reliability
Issue:: Volume 81(2018)
Page Start:: 1
Record Type:: Journal Article
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