Is Part Of: Microelectronics and reliability. Volume 63(2016) - British Library Electronic Legal Deposit Catalogue-Journal Issues and Articles Search Results

Is Part Of Microelectronics and reliability. Volume 63(2016)

1. A fusion prognostics-based qualification test methodology for microelectronic products. (August 2016)

Authors:: Pecht, Michael; Shibutani, Tadahiro; Kang, Myeongsu; Hodkiewicz, Melinda; Cripps, Edward
Journal:: Microelectronics and reliability
Issue:: Volume 63(2016)
Page Start:: 320
Record Type:: Journal Article
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗

2. A fusion prognostics-based qualification test methodology for microelectronic products. (August 2016)

Authors:: Pecht, Michael; Shibutani, Tadahiro; Kang, Myeongsu; Hodkiewicz, Melinda; Cripps, Edward
Journal:: Microelectronics and reliability
Issue:: Volume 63(2016)
Page Start:: 320
Record Type:: Journal Article
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗

3. An SEU resilient, SET filterable and cost effective latch in presence of PVT variations. (August 2016)

Authors:: Yan, Aibin; Liang, Huaguo; Huang, Zhengfeng; Jiang, Cuiyun; Ouyang, Yiming; Li, Xuejun
Journal:: Microelectronics and reliability
Issue:: Volume 63(2016)
Page Start:: 239
Record Type:: Journal Article
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗

4. An SEU resilient, SET filterable and cost effective latch in presence of PVT variations. (August 2016)

Authors:: Yan, Aibin; Liang, Huaguo; Huang, Zhengfeng; Jiang, Cuiyun; Ouyang, Yiming; Li, Xuejun
Journal:: Microelectronics and reliability
Issue:: Volume 63(2016)
Page Start:: 239
Record Type:: Journal Article
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗

5. Applications of the pulsed current-voltage (I-V) and capacitance-voltage (C-V) techniques for high-resistive gates in MOSFETs. (August 2016)

Authors:: Lai, LiLung; Wu, Xiaojing
Journal:: Microelectronics and reliability
Issue:: Volume 63(2016)
Page Start:: 22
Record Type:: Journal Article
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6. Applications of the pulsed current-voltage (I-V) and capacitance-voltage (C-V) techniques for high-resistive gates in MOSFETs. (August 2016)

Authors:: Lai, LiLung; Wu, Xiaojing
Journal:: Microelectronics and reliability
Issue:: Volume 63(2016)
Page Start:: 22
Record Type:: Journal Article
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗

7. Band diagram for low-k/Cu interconnects: The starting point for understanding back-end-of-line (BEOL) electrical reliability. (August 2016)

Authors:: Mutch, Michael J.; Pomorski, Thomas; Bittel, Brad C.; Cochrane, Corey J.; Lenahan, Patrick M.; Liu, Xin; Nemanich, Robert J.; Brockman, Justin; French, Marc; Kuhn, Markus; French, Benjamin; King, Sean W.
Journal:: Microelectronics and reliability
Issue:: Volume 63(2016)
Page Start:: 201
Record Type:: Journal Article
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗

8. Band diagram for low-k/Cu interconnects: The starting point for understanding back-end-of-line (BEOL) electrical reliability. (August 2016)

Authors:: Mutch, Michael J.; Pomorski, Thomas; Bittel, Brad C.; Cochrane, Corey J.; Lenahan, Patrick M.; Liu, Xin; Nemanich, Robert J.; Brockman, Justin; French, Marc; Kuhn, Markus; French, Benjamin; King, Sean W.
Journal:: Microelectronics and reliability
Issue:: Volume 63(2016)
Page Start:: 201
Record Type:: Journal Article
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗

9. Book Review. (August 2016)

Authors:: Gan, Chong Leong; Hashim, Uda
Journal:: Microelectronics and reliability
Issue:: Volume 63(2016)
Page Start:: 319
Record Type:: Journal Article
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗

10. Book Review. (August 2016)

Authors:: Gan, Chong Leong; Hashim, Uda
Journal:: Microelectronics and reliability
Issue:: Volume 63(2016)
Page Start:: 319
Record Type:: Journal Article
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗