Is Part Of: Microelectronics and reliability. Volume 60(2016) - British Library Electronic Legal Deposit Catalogue-Journal Issues and Articles Search Results

Is Part Of Microelectronics and reliability. Volume 60(2016)

1. A subgap density of states modeling for the transient characteristics in oxide-based thin-film transistors. (May 2016)

Authors:: Dai, Mingzhi
Journal:: Microelectronics and reliability
Issue:: Volume 60(2016)
Page Start:: 67
Record Type:: Journal Article
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗

2. A subgap density of states modeling for the transient characteristics in oxide-based thin-film transistors. (May 2016)

Authors:: Wang, Weiliang; Khan, Karim; Zhang, Xingye; Qin, Haiming; Jiang, Jun; Miao, Lijing; Jiang, Kemin; Wang, Pengjun; Dai, Mingzhi; Chu, Junhao
Journal:: Microelectronics and reliability
Issue:: Volume 60(2016)
Page Start:: 67
Record Type:: Journal Article
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗

3. A transient noise simulation model for the analysis of the optimal number of stages of the analog accumulator in TDI CMOS image sensors. (May 2016)

Authors:: Nie, Kaiming; Li, Jianxin; Gao, Zhiyuan; Xu, Jiangtao
Journal:: Microelectronics and reliability
Issue:: Volume 60(2016)
Page Start:: 70
Record Type:: Journal Article
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗

4. A transient noise simulation model for the analysis of the optimal number of stages of the analog accumulator in TDI CMOS image sensors. (May 2016)

Authors:: Nie, Kaiming; Li, Jianxin; Gao, Zhiyuan; Xu, Jiangtao
Journal:: Microelectronics and reliability
Issue:: Volume 60(2016)
Page Start:: 70
Record Type:: Journal Article
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗

5. Active defects in MOS devices on 4H-SiC: A critical review. (May 2016)

Authors:: Amini Moghadam, Hamid; Dimitrijev, Sima; Han, Jisheng; Haasmann, Daniel
Journal:: Microelectronics and reliability
Issue:: Volume 60(2016)
Page Start:: 1
Record Type:: Journal Article
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗

6. Active defects in MOS devices on 4H-SiC: A critical review. (May 2016)

Authors:: Amini Moghadam, Hamid; Dimitrijev, Sima; Han, Jisheng; Haasmann, Daniel
Journal:: Microelectronics and reliability
Issue:: Volume 60(2016)
Page Start:: 1
Record Type:: Journal Article
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗

7. An examination on the direct concentration approach to simulating moisture diffusion in a multi-material system. (May 2016)

Authors:: Liu, Dapeng; Wang, Jing; Liu, Ruiyang; Park, S.B.
Journal:: Microelectronics and reliability
Issue:: Volume 60(2016)
Page Start:: 109
Record Type:: Journal Article
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗

8. An examination on the direct concentration approach to simulating moisture diffusion in a multi-material system. (May 2016)

Authors:: Liu, Dapeng; Wang, Jing; Liu, Ruiyang; Park, S.B.
Journal:: Microelectronics and reliability
Issue:: Volume 60(2016)
Page Start:: 109
Record Type:: Journal Article
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗

9. Analysis of temperature dependence of linearity for SiGe HBTs in the avalanche region using Volterra series. (May 2016)

Authors:: Lee, Chie-In; Lin, Yan-Ting; Lin, Wei-Cheng
Journal:: Microelectronics and reliability
Issue:: Volume 60(2016)
Page Start:: 20
Record Type:: Journal Article
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗

10. Analysis of temperature dependence of linearity for SiGe HBTs in the avalanche region using Volterra series. (May 2016)

Authors:: Lee, Chie-In; Lin, Yan-Ting; Lin, Wei-Cheng
Journal:: Microelectronics and reliability
Issue:: Volume 60(2016)
Page Start:: 20
Record Type:: Journal Article
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗