Is Part Of: Microelectronics and reliability. Volume 144(2023) - British Library Electronic Legal Deposit Catalogue-Journal Issues and Articles Search Results

Is Part Of Microelectronics and reliability. Volume 144(2023)

1. A meta-heuristic search-based input vector control approach to co-optimize NBTI effect, PBTI effect, and leakage power simultaneously. (May 2023)

Authors:: Bhattacharjee, Abhishek; Das, Apangshu; Sahu, Dheeraj Kumar; Pradhan, Sambhu Nath; Das, Kaushik
Journal:: Microelectronics and reliability
Issue:: Volume 144(2023)
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2. A RUL prediction method for lithium-ion batteries based on improved singular spectrum analysis and CSA-KELM. (May 2023)

Authors:: Ding, Guorong; Chen, Hongxia
Journal:: Microelectronics and reliability
Issue:: Volume 144(2023)
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3. A survey of the structure, fabrication, and characterization of advanced organic light emitting diodes. (May 2023)

Authors:: Nayak, Debashish; Choudhary, Ram Bilash
Journal:: Microelectronics and reliability
Issue:: Volume 144(2023)
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4. A triple-node-upset self-recoverable design based on Schmitt-triggers and C-elements. (May 2023)

Authors:: Xu, Hui; Liu, Chaoming; Ma, Ruijun; Liang, Huaguo; Huang, Zhengfeng; Zhou, Jing; Zhu, Shuo
Journal:: Microelectronics and reliability
Issue:: Volume 144(2023)
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5. An inter-scale simulation method for TSV 3D IC based on linear superposition algorithm and TSV model sharing strategy. (May 2023)

Authors:: Wu, Xiaodong; Ma, Shenglin; Wang, Zhizhen; Wang, Wei; Jin, Yufeng
Journal:: Microelectronics and reliability
Issue:: Volume 144(2023)
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6. Automated design and usage of the Fault-Tolerant dynamic partial reconfiguration controller for FPGAs. (May 2023)

Authors:: Lojda, Jakub; Panek, Richard; Sekanina, Lukas; Kotasek, Zdenek
Journal:: Microelectronics and reliability
Issue:: Volume 144(2023)
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7. Editorial Board. (May 2023)

Journal:: Microelectronics and reliability
Issue:: Volume 144(2023)
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8. Effect of oxygen plasma on ITO surface and OLED physical properties. (May 2023)

Authors:: Yahya, M.; Fadavieslam, M.R.
Journal:: Microelectronics and reliability
Issue:: Volume 144(2023)
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9. Evaluation of SEU impact on convolutional neural networks based on BRAM and CRAM in FPGAs. (May 2023)

Authors:: Tian, Haonan; Ibrahim, Younis; Chen, Rui; Jin, Chen; Shi, Shuting; Xing, Jiesi; Li, Jianjun; Chen, Li
Journal:: Microelectronics and reliability
Issue:: Volume 144(2023)
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10. Improvement of single event effects in InP-based HEMT with a composite channel of InGaAs/InAs/InGaAs. (May 2023)

Authors:: Sun, Shuxiang; Xie, Xintong; Zang, Pengfei; Luo, Xiaorong
Journal:: Microelectronics and reliability
Issue:: Volume 144(2023)
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Record Type:: Journal Article
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