Is Part Of: Microelectronics and reliability. Volume 118(2021) - British Library Electronic Legal Deposit Catalogue-Journal Issues and Articles Search Results

Is Part Of Microelectronics and reliability. Volume 118(2021)

1. Computational evaluation of optimal reservoir and sink lengths for threshold current density of electromigration damage considering void and hillock formation. (March 2021)

Authors:: Takaya, Ryuji; Sasagawa, Kazuhiko; Moriwaki, Takeshi; Fujisaki, Kazuhiro
Journal:: Microelectronics and reliability
Issue:: Volume 118(2021)
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Record Type:: Journal Article
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2. Editorial Board. (March 2021)

Journal:: Microelectronics and reliability
Issue:: Volume 118(2021)
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3. Engineering application research on reliability prediction of the combined DC-DC power supply. (March 2021)

Authors:: He, Yuchen; Zhang, Haiming; Wang, Pingzhou; Huang, Yunzhi; Chen, Zhiwei; Zhang, Yingying
Journal:: Microelectronics and reliability
Issue:: Volume 118(2021)
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Record Type:: Journal Article
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4. FEM model calibration for simulation aided thermal design. (March 2021)

Authors:: Cioban, R.; Szőke, Sz.; Zaharie-B, D.; Kórádi, Z.; Leordean, C.; Simon, S.
Journal:: Microelectronics and reliability
Issue:: Volume 118(2021)
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5. Improving the reliability of SRAM-based PUFs under varying operation conditions and aging degradation. (March 2021)

Authors:: Saraza-Canflanca, P.; Carrasco-Lopez, H.; Santana-Andreo, A.; Brox, P.; Castro-Lopez, R.; Roca, E.; Fernandez, F.V.
Journal:: Microelectronics and reliability
Issue:: Volume 118(2021)
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6. Influence of post-bonding heating process on the long-term reliability of Cu/Al contact. (March 2021)

Authors:: Eto, Motoki; Araki, Noritoshi; Yamada, Takashi; Sugiyama, Masaaki; Fujimoto, Shinji
Journal:: Microelectronics and reliability
Issue:: Volume 118(2021)
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7. Reduced length redundancy adaptive protection for the cascaded integrator-comb interpolation filter on FPGA. (March 2021)

Authors:: Gear, Kyle W.; Sánchez-Macián, Alfonso; Maestro, Juan Antonio
Journal:: Microelectronics and reliability
Issue:: Volume 118(2021)
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8. Reliability analysis for TO-247 multilayered power module packaging under mechanical oscillation based on finite element method. (March 2021)

Authors:: Ghaderi, Davood
Journal:: Microelectronics and reliability
Issue:: Volume 118(2021)
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9. Ruggedness of Dual-GCT against dynamic avalanche and surge current. (March 2021)

Authors:: Yang, Wuhua; Wang, Cailin; Yang, Jing; Zhang, Qi; Su, Le
Journal:: Microelectronics and reliability
Issue:: Volume 118(2021)
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10. Stochastic behavioral models for system level reliability analysis including non-normal and correlated process variation. (March 2021)

Authors:: Taddiken, Maike; Hillebrand, Theodor; Peters-Drolshagen, Dagmar; Paul, Steffen
Journal:: Microelectronics and reliability
Issue:: Volume 118(2021)
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Record Type:: Journal Article
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