Is Part Of: Microelectronics and reliability. Volume 110(2020) - British Library Electronic Legal Deposit Catalogue-Journal Issues and Articles Search Results

Is Part Of Microelectronics and reliability. Volume 110(2020)

1. Analyzing the impact of soft errors in VGG networks implemented on GPUs. (July 2020)

Authors:: Wei, Jinghe; Ibrahim, Younis; Qian, Siyu; Wang, Haibin; Liu, Guozhu; Yu, Qingkui; Qian, Rong; Shi, Junwei
Journal:: Microelectronics and reliability
Issue:: Volume 110(2020)
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Record Type:: Journal Article
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2. Comparison study of gold coatings prepared by traditional and modified galvanic replacement deposition for corrosion prevention of copper. (July 2020)

Authors:: Zhang, Xingkai; Qian, Qingyi; Qiang, Li; Zhang, Bin; Zhang, Junyan
Journal:: Microelectronics and reliability
Issue:: Volume 110(2020)
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3. CSTBT™ technology for high voltage applications with high dynamic robustness and low overall loss. (July 2020)

Authors:: Nakamura, Katsumi; Chen, Ze; Nishizawa, Shin-ichi; Furukawa, Akihiko
Journal:: Microelectronics and reliability
Issue:: Volume 110(2020)
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4. Defect inspection of flip chip solder joints based on non-destructive methods: A review. (July 2020)

Authors:: Su, Lei; Yu, Xiaonan; Li, Ke; Pecht, Michael
Journal:: Microelectronics and reliability
Issue:: Volume 110(2020)
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5. Editorial Board. (July 2020)

Journal:: Microelectronics and reliability
Issue:: Volume 110(2020)
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6. Failure mechanism of lead-free component boards in thermomechanical test based on recrystallization enhanced cracking. (July 2020)

Authors:: Xu, Hongbo; Liu, Fa; Zhou, Li; Zhao, Hongyun; Li, Mingyu
Journal:: Microelectronics and reliability
Issue:: Volume 110(2020)
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7. Fault diagnosis and prognosis based on physical knowledge and reliability data: Application to MOS Field-Effect Transistor. (July 2020)

Authors:: Djeziri, M.A.; Benmoussa, S.; Mouchaweh, M. Sayed; Lughofer, E.
Journal:: Microelectronics and reliability
Issue:: Volume 110(2020)
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8. High-energy proton irradiation effects on GaN hybrid-drain-embedded gate injection transistors. (July 2020)

Authors:: Floriduz, Alessandro; Devine, James D.
Journal:: Microelectronics and reliability
Issue:: Volume 110(2020)
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9. In-situ service load monitoring of automotive electronic systems using silicon-based piezoresistive stress sensor. (July 2020)

Authors:: Yang, Yu-Hsiang; Han, Bongtae; Prisacaru, Alexandru; Gromala, Przemyslaw; Jiang, Shengbing; Sarwar, Azeem
Journal:: Microelectronics and reliability
Issue:: Volume 110(2020)
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Record Type:: Journal Article
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10. Mechanical integrity of back-end-of-line with Ru nanowires and airgaps. (July 2020)

Authors:: Zahedmanesh, Houman; Vanstreels, Kris
Journal:: Microelectronics and reliability
Issue:: Volume 110(2020)
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