Is Part Of: Microelectronics and reliability. Volume 108(2020) - British Library Electronic Legal Deposit Catalogue-Journal Issues and Articles Search Results

Is Part Of Microelectronics and reliability. Volume 108(2020)

1. Change in trap characteristics during fatigue of Au/BiFeO3/SrRuO3. (May 2020)

Authors:: Jin, Lei; Zhu, Hui; Chu, Daping; Yang, Ying; Wang, Chen; Xie, Na; Huang, Zeng; Liu, Jiahui
Journal:: Microelectronics and reliability
Issue:: Volume 108(2020)
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Record Type:: Journal Article
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2. Editorial Board. (May 2020)

Journal:: Microelectronics and reliability
Issue:: Volume 108(2020)
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3. Editorial Board. (May 2020)

Journal:: Microelectronics and reliability
Issue:: Volume 108(2020)
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4. Effect of micromorphology on corrosion and mechanical properties of SAC305 lead-free solders. (May 2020)

Authors:: Chen, G.; Wang, X.H.; Yang, J.; Xu, W.L.; Lin, Q.
Journal:: Microelectronics and reliability
Issue:: Volume 108(2020)
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5. Electrostatic discharge robustness of amorphous indium-gallium-zinc-oxide thin-film transistors. (May 2020)

Authors:: Simicic, Marko; Ashif, Nowab Reza; Hellings, Geert; Chen, Shih-Hung; Nag, Manoj; Kronemeijer, Auke Jisk; Myny, Kris; Linten, Dimitri
Journal:: Microelectronics and reliability
Issue:: Volume 108(2020)
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6. Enhancing die level static fault isolation on power gated devices. (May 2020)

Authors:: Nagalingam, D.; Quah, A.C.T.; Moon, S.J.; Parab, S.M.; Ng, P.T.; Ting, S.L.; Ma, H.H.; Chen, C.Q.
Journal:: Microelectronics and reliability
Issue:: Volume 108(2020)
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7. Evaluation of thermal conductivity for sintered silver considering aging effect with microstructure based model. (May 2020)

Authors:: Qin, Fei; Hu, Yuankun; Dai, Yanwei; An, Tong; Chen, Pei
Journal:: Microelectronics and reliability
Issue:: Volume 108(2020)
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8. In situ investigation of atmospheric corrosion behavior of copper under thin electrolyte layer and static magnetic field. (May 2020)

Authors:: Yu, Xueyong; Wang, Zehua; Lu, Zihan
Journal:: Microelectronics and reliability
Issue:: Volume 108(2020)
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9. Investigation of radiation-induced degradations in four-junction solar cell by experiment and simulation. (May 2020)

Authors:: Peng, Chao; Ding, Fei; Lei, Zhifeng; Zhang, Zhangang; En, Yunfei; Huang, Yun
Journal:: Microelectronics and reliability
Issue:: Volume 108(2020)
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10. Over-stress and under-stress effects in CDM testing. (May 2020)

Authors:: O'Sullivan, Greg; Smedes, Theo; Derikx, Richard; Garcia, Artemio; Knoppers, Bob
Journal:: Microelectronics and reliability
Issue:: Volume 108(2020)
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