Change in trap characteristics during fatigue of Au/BiFeO3/SrRuO3. (May 2020)

• Record Type: Journal Article
• Authors: Jin, Lei; Zhu, Hui; Chu, Daping; Yang, Ying; Wang, Chen; Xie, Na; Huang, Zeng; Liu, Jiahui
• Is Part Of: Microelectronics and reliability. Volume 108(2020)
• Publication Date: 2020-05
• Subjects: Resistive switching -- Current transient -- Low temperature -- Fatigue -- Oxygen vacancies; Electronic apparatus and appliances -- Reliability -- Periodicals; Miniature electronic equipment -- Periodicals; Appareils électroniques -- Fiabilité -- Périodiques; Équipement électronique miniaturisé -- Périodiques; Electronic apparatus and appliances -- Reliability; Miniature electronic equipment; Periodicals; 621.3815
• DOI: 10.1016/j.microrel.2020.113638
• Languages: English
• ISSNs: 0026-2714

Abstract

Abstract: We studied the change of trap characteristics during fatigue cycling process in Au/BiFeO3 /SrRuO3 . The resistive switching effect of the structure was caused by the trapping/detrapping of charge carriers. The correlated trap states were analyzed by using the current transient method, which can extract a more complete trap information at low temperature compared with that at the room temperature, because of the slowing down of the thermally activated detrapping behavior as the temperature decrease. The time constant of the traps during fatigue increased first and then decreased, while the trap levels remained unchanged. A new time constant and trap level can be generated by fatigue at low temperature. We attributed such variation in trap characteristics to the change of polarization ordering and trap densities caused by the release of polarization domains in the wake-up stage and by generation of oxygen vacancies during fatigue.