Journal: Microelectronics and reliability / Issue: Volume 55:Issue 12 Part B(2015) - British Library Electronic Legal Deposit Catalogue-Journal Issues and Articles Search Results

Journal Microelectronics and reliability Issue Volume 55:Issue 12 Part B(2015)

1. A novel photodiode based on Ruthenium(II) complex containing polydentate pyridine as photocatalyst. Issue 12 (December 2015)

Authors:: Soylu, M.; Orak, I.; Dayan, O.; Serbetci, Z.
Journal:: Microelectronics and reliability
Issue:: Volume 55:Issue 12 Part B(2015)
Page Start:: 2685
Record Type:: Journal Article
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗

2. Accelerated aging and thermal cycling of low melting temperature alloys as wet thermal interface materials. Issue 12 (December 2015)

Authors:: Roy, Chandan K.; Bhavnani, Sushil; Hamilton, Michael C.; Johnson, R. Wayne; Knight, Roy W.; Harris, Daniel K.
Journal:: Microelectronics and reliability
Issue:: Volume 55:Issue 12 Part B(2015)
Page Start:: 2698
Record Type:: Journal Article
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗

3. Adding a self-reset feature to the Bulk-BICS with dynamic storage cell. Issue 12 (December 2015)

Authors:: Simionovski, Alexandre; Wirth, Gilson
Journal:: Microelectronics and reliability
Issue:: Volume 55:Issue 12 Part B(2015)
Page Start:: 2748
Record Type:: Journal Article
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗

4. AlN capping layer inserted between Cu and SiCN dielectric barrier layer for enhancing reliability of 28 nm technological node and beyond. Issue 12 (December 2015)

Authors:: Zhou, Ming
Journal:: Microelectronics and reliability
Issue:: Volume 55:Issue 12 Part B(2015)
Page Start:: 2705
Record Type:: Journal Article
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗

5. Breakdown data generation and in-die deconvolution methodology to address BEOL and MOL dielectric breakdown challenges. Issue 12 (December 2015)

Authors:: Chen, F.; Graas, Carole; Shinosky, Michael; Zhao, Kai; Narasimha, Shreesh; Liu, Xiao Hu; Tian, Chunyan
Journal:: Microelectronics and reliability
Issue:: Volume 55:Issue 12 Part B(2015)
Page Start:: 2727
Record Type:: Journal Article
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗

6. Comparative evaluation of the short-circuit withstand capability of 1.2 kV silicon carbide (SiC) power transistors in real life applications. Issue 12 (December 2015)

Authors:: Kampitsis, Georgios; Papathanassiou, Stavros; Manias, Stefanos
Journal:: Microelectronics and reliability
Issue:: Volume 55:Issue 12 Part B(2015)
Page Start:: 2640
Record Type:: Journal Article
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗

7. Development of C-Line plot technique for the characterization of edge effects in acoustic imaging: A case study using flip chip package geometry. Issue 12 (December 2015)

Authors:: Lee, Chean Shen; Zhang, Guang-Ming; Harvey, David M.; Ma, Hong-Wei
Journal:: Microelectronics and reliability
Issue:: Volume 55:Issue 12 Part B(2015)
Page Start:: 2762
Record Type:: Journal Article
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗

8. Dynamic compact thermal model of high power light emitting diode. Issue 12 (December 2015)

Authors:: Lai, Wei; Liu, Xianming; Chen, Weimin; Lei, Xiaohua; Cao, Xueying
Journal:: Microelectronics and reliability
Issue:: Volume 55:Issue 12 Part B(2015)
Page Start:: 2663
Record Type:: Journal Article
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗

9. Editorial Board. Issue 12 (December 2015)

Journal:: Microelectronics and reliability
Issue:: Volume 55:Issue 12 Part B(2015)
Page Start:: IFC
Record Type:: Journal Article
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗

10. Effect of NBTI/PBTI aging and process variations on write failures in MOSFET and FinFET flip-flops. Issue 12 (December 2015)

Authors:: Khalid, Usman; Mastrandrea, Antonio; Olivieri, Mauro
Journal:: Microelectronics and reliability
Issue:: Volume 55:Issue 12 Part B(2015)
Page Start:: 2614
Record Type:: Journal Article
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗