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You searched for: Journal Solid-state electronics Issue Volume 129(2017)Limit your search
- 621.38152 35
- Semiconducteurs -- Périodiques 35
- Semiconductors -- Periodicals 35
- 4H-SiC -- VDMOSFET -- Breakdown voltage -- Junction termination 1
- AlGaN/GaN -- HEMT -- Small-signal -- Mesa -- Capacitance 1
- AlGaN/GaN -- Nanochannel -- Omega-gate -- FinFET -- 2DEG -- Breakdown voltage -- Subthreshold slope 1
- AlGaNGaN -- HEMT -- Ohmic contact -- Patterned etching -- Surface morphology 1
- Bottom-gate -- Polycrystalline silicon (poly-Si) -- Thin-film transistor (TFT) -- Self-aligned -- Hot-carrier -- Kink-effect 1
- Breakdown voltage -- Body resistance -- Body contact -- Lateral BJT -- SOI LDMOSFET 1
- CMOS -- Electrostatics -- Nanowire transistors -- Performance -- Quantum effects -- TCAD 1