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You searched for: Journal Solid-state electronics Issue Volume 124(2016)Limit your search
- 621.38152 24
- Semiconducteurs -- Périodiques 24
- Semiconductors -- Periodicals 24
- Computer-aided design (CAD) -- Indium gallium zinc oxide (IGZO) -- Thin-film transistor (TFT) -- Surface potential 2
- Electrostatic discharge (ESD) -- Output driver -- Silicon-controlled rectifier (SCR) 2
- GaN -- MIS-HEMT -- Surface treatment -- Leakage current -- Breakdown voltage -- TMAH 2
- Heterostructure field-effect transistor (HFET) -- Temperature-dependent I-V characteristics -- Electrophoretic deposition (EPD) -- Reverse micelle 2
- HfO2 -- Analytical model -- Surface potential -- Ferroelectric -- Nonvolatile memory -- Fe-TFET 2
- Homojunction tunnel FETs -- Heterojunction tunnel FETs -- Reliability -- Monte Carlo simulations -- Parameter variations -- InAs -- GaAsSb 2
- Junctionless transistors (JLT) -- Subthreshold conduction -- Less effective barrier height -- Subthreshold slope -- Diffusion current -- DIBL 2