1. Atom probe tomography for advanced nanoelectronic devices: Current status and perspectives. (15th April 2018) Authors: Barnes, J.P.; Grenier, A.; Mouton, I.; Barraud, S.; Audoit, G.; Bogdanowicz, J.; Fleischmann, C.; Melkonyan, D.; Vandervorst, W.; Duguay, S.; Rolland, N.; Vurpillot, F.; Blavette, D. Journal: Scripta materialia Issue: Number 148(2018) Page Start: 91 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. Cesium/Xenon dual beam sputtering in a Cameca instrument. (22nd September 2014) Authors: Pureti, R.; Douhard, B.; Joris, D.; Merkulov, A.; Vandervorst, W.; Lee, Yeonhee; Moon, DaeWon; Kang, Hee Jae; Kim, Kyung Joong; Lee, Tae Geol; Lee, Jae Cheol; Yi, Keewook; Hong, Tae Eun Journal: Surface and interface analysis Issue: Volume 46:Number 1(2014:Jan.) Page Start: 25 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
3. Characterization of organic solar cell materials by G‐SIMS. (31st July 2012) Authors: Franquet, A.; Conard, T.; Voroshazi, E.; Poleunis, C.; Cheyns, D.; Vandervorst, W. Journal: Surface and interface analysis Issue: Volume 45:Number 1(2013:Jan.) Page Start: 430 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
4. Degradation of deep ultraviolet photoresist by As‐implantation studied by Ar‐cluster beam profiling. (1st August 2012) Authors: Conard, T.; Franquet, A.; Tsvetanova, D.; Mouhib, T.; Vandervorst, W. Journal: Surface and interface analysis Issue: Volume 45:Number 1(2013:Jan.) Page Start: 406 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
5. Dopant, composition and carrier profiling for 3D structures. (May 2017) Authors: Vandervorst, W.; Fleischmann, C.; Bogdanowicz, J.; Franquet, A.; Celano, U.; Paredis, K.; Budrevich, A. Journal: Materials science in semiconductor processing Issue: Volume 62(2017) Page Start: 31 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
6. Fundamental aspects of Arn+ SIMS profiling of common organic semiconductors. (28th July 2014) Authors: Fleischmann, C.; Conard, T.; Havelund, R.; Franquet, A.; Poleunis, C.; Voroshazi, E.; Delcorte, A.; Vandervorst, W.; Lee, Yeonhee; Moon, DaeWon; Kang, Hee Jae; Kim, Kyung Joong; Lee, Tae Geol; Lee, Jae Cheol; Yi, Keewook; Hong, Tae Eun Journal: Surface and interface analysis Issue: Volume 46:Number 1(2014:Jan.) Page Start: 54 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
7. G‐SIMS analysis of organic solar cell materials. (12th September 2014) Authors: Franquet, A.; Fleischmann, C.; Conard, T.; Voroshazi, E.; Poleunis, C.; Havelund, R.; Delcorte, A.; Vandervorst, W.; Lee, Yeonhee; Moon, DaeWon; Kang, Hee Jae; Kim, Kyung Joong; Lee, Tae Geol; Lee, Jae Cheol; Yi, Keewook; Hong, Tae Eun Journal: Surface and interface analysis Issue: Volume 46:Number 1(2014:Jan.) Page Start: 96 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
8. Initial growth stages of heavily boron‐doped HFCVD diamond for electrical probe application. Issue 10 (6th August 2013) Authors: Simon, D. K.; Tsigkourakos, M.; Hantschel, T.; Conard, T.; Vandervorst, W. Journal: Physica status solidi Issue: Volume 210:Issue 10(2013:Oct.) Page Start: 2002 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
9. Insights into the nanoscale lateral and vertical phase separation in organic bulk heterojunctions via scanning probe microscopy. Issue 6 (26th January 2016) Authors: Chintala, R.; Tait, J. G.; Eyben, P.; Voroshazi, E.; Surana, S.; Fleischmann, C.; Conard, T.; Vandervorst, W. Journal: Nanoscale Issue: Volume 8:Issue 6(2016) Page Start: 3629 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
10. Nanoscopic structural rearrangements of the Cu-filament in conductive-bridge memories. Issue 29 (1st February 2016) Authors: Celano, U.; Giammaria, G.; Goux, L.; Belmonte, A.; Jurczak, M.; Vandervorst, W. Journal: Nanoscale Issue: Volume 8:Issue 29(2016) Page Start: 13915 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗