Characterization of organic solar cell materials by G‐SIMS. (31st July 2012)

• Record Type: Journal Article
• Authors: Franquet, A.; Conard, T.; Voroshazi, E.; Poleunis, C.; Cheyns, D.; Vandervorst, W.
• Is Part Of: Surface and interface analysis. Volume 45:Number 1(2013:Jan.)
• Page Start: 430
• Page End: 433
• Publication Date: 2012-07-31
• Subjects: Surfaces (Physics) -- Periodicals; Surface chemistry -- Periodicals; Thin films -- Periodicals; 541.33
• DOI: 10.1002/sia.5128
• Languages: English
• ISSNs: 0142-2421

Abstract

<abstract abstract-type="main"> <title> <x xml:space="preserve">Abstract</x> </title> <p>In this study, the gentle SIMS (G‐SIMS) method has been applied to organic solar cell materials. Various primary ion conditions were used to generate the G‐SIMS spectra; monoatomic and cluster sources with different energies were tested. It is shown that the G‐SIMS concept helps to identify both PCBM and P3HT materials through the enhancement of molecular and characteristic ions of the two molecules. Copyright © 2012 John Wiley &amp; Sons, Ltd.</p> </abstract>