1. Cross-correlation based high resolution electron backscatter diffraction and electron channelling contrast imaging for strain mapping and dislocation distributions in InAlN thin films. (15th February 2017) Authors: Vilalta-Clemente, A.; Naresh-Kumar, G.; Nouf-Allehiani, M.; Gamarra, P.; di Forte-Poisson, M.A.; Trager-Cowan, C.; Wilkinson, A.J. Journal: Acta materialia Issue: Volume 125(2017) Page Start: 125 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. Dislocation contrast in electron channelling contrast images as projections of strain-like components. (2018) Authors: Pascal, E.; Hourahine, B.; Naresh-Kumar, G.; Mingard, K.; Trager-Cowan, C. Journal: Materials today Issue: Volume 5:Number 6(2018)Part 3 Page Start: 14652 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
3. Electron Channeling Contrast Imaging of Defects in III-Nitride Semiconductors. (August 2014) Authors: Trager-Cowan, C.; Naresh-Kumar, G.; Allehiani, N.; Kraeusel, S.; Hourahine, B.; Vespucci, S.; Thomson, D.; Bruckbauer, J.; Kusch, G.; Edwards, P. R.; Martin, R. W.; Mauder, C.; Day, A. P.; Winkelmann, A.; Vilalta-Clemente, A.; Wilkinson, A. J.; Parbrook, P. J.; Kappers, M. J.; Moram, M. A.; Olive... Journal: Microscopy and microanalysis Issue: Volume 20(2014)Supplement 3 Page Start: 1024 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
4. Electron Channeling Contrast Imaging of Defects in III-Nitride Semiconductors. (August 2014) Authors: Trager-Cowan, C.; Naresh-Kumar, G.; Allehiani, N.; Kraeusel, S.; Hourahine, B.; Vespucci, S.; Thomson, D.; Bruckbauer, J.; Kusch, G.; Edwards, P. R.; Martin, R. W.; Mauder, C.; Day, A. P.; Winkelmann, A.; Vilalta-Clemente, A.; Wilkinson, A. J.; Parbrook, P. J.; Kappers, M. J.; Moram, M. A.; Olive... Journal: Microscopy and microanalysis Issue: Volume 20:Number 3(2014:Jun.) Page Start: 1024 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
5. Electron channelling contrast imaging for III-nitride thin film structures. (1st June 2016) Authors: Naresh-Kumar, G.; Thomson, D.; Nouf-Allehiani, M.; Bruckbauer, J.; Edwards, P.R.; Hourahine, B.; Martin, R.W.; Trager-Cowan, C. Journal: Materials science in semiconductor processing Issue: Volume 47(2016:Jun.) Page Start: 44 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
6. Electron Channelling Contrast Imaging in a Low Voltage Scanning Electron Microscope. (August 2019) Authors: Naresh-Kumar, G.; Trager-Cowan, C.; Mingard, K. P. Journal: Microscopy and microanalysis Issue: Volume 25:(2022)Supplement 2 Page Start: 504 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
7. Imaging Extended Defects in Low Z materials using Electron Channelling Contrast Imaging – New Approaches and Challenges. (August 2019) Authors: Naresh-Kumar, G.; Alasamari, A.; Hourahine, Ben; Trager-Cowan, C. Journal: Microscopy and microanalysis Issue: Volume 25:(2022)Supplement 2 Page Start: 1760 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
8. Polarity Determination in GaN Nanowires by Electron Backscatter Diffraction. (August 2019) Authors: Naresh-Kumar, G.; Trager-Cowan, C.; Winkelmann, A. Journal: Microscopy and microanalysis Issue: Volume 25:(2022)Supplement 2 Page Start: 2404 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
9. Reprint of: Electron channelling contrast imaging for III-nitride thin film structures. (15th November 2016) Authors: Naresh-Kumar, G.; Thomson, D.; Nouf-Allehiani, M.; Bruckbauer, J.; Edwards, P.R.; Hourahine, B.; Martin, R.W; Trager-Cowan, C. Journal: Materials science in semiconductor processing Issue: Volume 55(2016:Nov.) Page Start: 19 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
10. Reprint of: Electron channelling contrast imaging for III-nitride thin film structures. (15th November 2016) Authors: Naresh-Kumar, G.; Thomson, D.; Nouf-Allehiani, M.; Bruckbauer, J.; Edwards, P.R.; Hourahine, B.; Martin, R.W; Trager-Cowan, C. Journal: Materials science in semiconductor processing Issue: Volume 55(2016:Nov.) Page Start: 19 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗