Author/Creator: Theodorou, C. - British Library Electronic Legal Deposit Catalogue-Journal Issues and Articles Search Results

Author/Creator Theodorou, C.

1. Comprehensive Kubo-Greenwood modelling of FDSOI MOS devices down to deep cryogenic temperatures. (June 2022)

Authors:: Serra di Santa Maria, F.; Contamin, L.; Cassé, M.; Theodorou, C.; Balestra, F.; Ghibaudo, G.
Journal:: Solid-state electronics
Issue:: Volume 192(2022)
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Record Type:: Journal Article
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2. Detailed electrical characterization of 200 mm CMOS compatible GaN/Si HEMTs down to deep cryogenic temperatures. (November 2022)

Authors:: Kim, Donghyun; Theodorou, C.; Chanuel, A.; Gobil, Y.; Charles, M.; Morvan, E.; Woo Lee, Jae; Mouis, M.; Ghibaudo, G.
Journal:: Solid-state electronics
Issue:: Volume 197(2022)
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Record Type:: Journal Article
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3. Effect of SOI substrate on silicon nitride resistance switching using MIS structure. (August 2022)

Authors:: Mavropoulis, A.; Vasileiadis, N.; Theodorou, C.; Sygellou, L.; Normand, P.; Ch. Sirakoulis, G.; Dimitrakis, P.
Journal:: Solid-state electronics
Issue:: Volume 194(2022)
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Record Type:: Journal Article
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4. Inter-tier electrostatic coupling effects in 3D sequential integration devices and circuits. (June 2020)

Authors:: Sideris, P.; Brunet, L.; Ciampolini, L.; Sicard, G.; Batude, P.; Theodorou, C.
Journal:: Solid-state electronics
Issue:: Volume 168(2020)
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Record Type:: Journal Article
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5. Lambert-W function-based parameter extraction for FDSOI MOSFETs down to deep cryogenic temperatures. (December 2021)

Authors:: Serra di Santa Maria, F.; Contamin, L.; Cardoso Paz, B.; Cassé, M.; Theodorou, C.; Balestra, F.; Ghibaudo, G.
Journal:: Solid-state electronics
Issue:: Volume 186(2021)
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Record Type:: Journal Article
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6. Modelling of self-heating effect in FDSOI and bulk MOSFETs operated in deep cryogenic conditions. (June 2022)

Authors:: Ghibaudo, G.; Cassé, M.; di Santa Maria, F. Serra; Theodorou, C.; Balestra, F.
Journal:: Solid-state electronics
Issue:: Volume 192(2022)
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Record Type:: Journal Article
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7. New insights into low frequency noise (LFN) sources analysis in GaN/Si MIS-HEMTs. (February 2023)

Authors:: Kom Kammeugne, R.; Theodorou, C.; Leroux, C.; Vauche, L.; Mescot, X.; Gwoziecki, R.; Becu, S.; Charles, M.; Bano, E.; Ghibaudo, G.
Journal:: Solid-state electronics
Issue:: Volume 200(2023)
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Record Type:: Journal Article
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8. On the diffusion current in a MOSFET operated down to deep cryogenic temperatures. (February 2021)

Authors:: Ghibaudo, G.; Aouad, M.; Casse, M.; Poiroux, T.; Theodorou, C.
Journal:: Solid-state electronics
Issue:: Volume 176(2021)
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Record Type:: Journal Article
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9. Reducing Leg Length Discrepancy After Hip Hemi-Arthroplasty Using the Arcad Symbios System. (November 2017)

Authors:: Shanmugam, C.; Toma, O.; Williams, M.; McFadyen, E.; Theodorou, C.; Trounce, J.
Journal:: International journal of surgery
Issue:: Volume 47(2017)Supplement 1
Page Start:: S86
Record Type:: Journal Article
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