1. An effect of measurement conditions on the depth resolution for low‐energy dual‐beam depth profiling using TOF‐SIMS. (25th March 2013) Authors: Murase, Atsushi; Mitsuoka, Takuya; Tomita, Mitsuhiro; Takenaka, Hisataka; Morita, Hiromi Journal: Surface and interface analysis Issue: Volume 45:Number 8(2013:Aug.) Page Start: 1261 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. Fabrication and Performance Test of Fresnel Zone Plate with 35 nm Outermost Zone Width in Hard X-Ray Region. (5th July 2010) Authors: Suzuki, Yoshio; Takeuchi, Akihisa; Takenaka, Hisataka; Okada, Ikuo Other Names: Khounsary Ali Academic Editor. Journal: X-ray optics and instrumentation Issue: Volume 2010(2010) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
3. Oxygen accumulation effect for depth profiling of thin‐multilayered sample using low‐energy oxygen ion beam. (17th July 2012) Authors: Nishinomiya, Suguru; Kubota, Naoyoshi; Hayashi, Shun‐ichi; Takenaka, Hisataka Journal: Surface and interface analysis Issue: Volume 45:Number 1(2013:Jan.) Page Start: 107 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
4. Point spread function measurement of an X‐ray beam focused by a multilayer zone plate with narrow annular aperture. (24th January 2014) Authors: Takano, Hidekazu; Konishi, Shigeki; Koyama, Takahisa; Tsusaka, Yoshiyuki; Ichimaru, Satoshi; Ohchi, Tadayuki; Takenaka, Hisataka; Kagoshima, Yasushi Journal: Journal of synchrotron radiation Issue: Volume 21:Part 2(2014) Page Start: 446 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗