Fabrication and Performance Test of Fresnel Zone Plate with 35 nm Outermost Zone Width in Hard X-Ray Region. (5th July 2010)

• Record Type: Journal Article
• Authors: Suzuki, Yoshio; Takeuchi, Akihisa; Takenaka, Hisataka; Okada, Ikuo
• Other Names: Khounsary Ali Academic Editor.
• Is Part Of: X-ray optics and instrumentation. Volume 2010(2010)
• Publication Date: 2010-07-05
• Subjects: X-ray optics -- Periodicals; X-ray optics; Periodicals; Electronic journals; 621.361
• DOI: 10.1155/2010/824387
• Languages: English
• ISSNs: 1687-7632

Abstract

Abstract : A Fresnel zone plate (FZP) with 35 nm outermost zone width has been fabricated and tested in the hard X-ray region. The FZP was made by electron beam lithography and reactive ion etching technique. The performance test of the FZP was carried out by measuring the focused beam profile for coherent hard X-ray beam at the beamline 20XU of SPring-8. The full width at half maximum of the focused beam profile measured by knife-edge scan method is34.9 ± 2.7 nm, that agrees well with the theoretical value of diffraction-limited resolution. Applications to scanning microscopy were also carried out.