Author/Creator: Specht, Petra - British Library Electronic Legal Deposit Catalogue-Journal Issues and Articles Search Results

Authors:: Anderson, Travis J; Koehler, Andrew D.; Specht, Petra; Weaver, Brad D; Greenlee, Jordan D; Tadjer, Marko J; Hite, Jennifer K; Mastro, Michael A; Porter, Matthew; Wade, Michael; Dubon, Oscar; Luysberg, Martina; Hobart, Karl D; Weatherford, Todd R; Kub, Fritz J
Journal:: ECS transactions
Issue:: Volume 66:Number 1(2015)
Page Start:: 15
Record Type:: Journal Article
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Authors:: Koehler, Andrew D.; Anderson, Travis J; Specht, Petra; Weaver, Brad D; Greenlee, Jordan D; Tadjer, Marko J; Shahin, David I; Hobart, Karl D; Kub, Francis J
Journal:: ECS transactions
Issue:: Volume 69:Number 11(2015)
Page Start:: 57
Record Type:: Journal Article
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Authors:: Kisielowski, Christian; Specht, Petra; Freitag, Bert; Kieft, Erik R.; Verhoeven, Wouter; van Rens, Jasper F. M.; Mutsaers, Peter; Luiten, Jom; Rozeveld, Steve; Kang, Joo; McKenna, Alyssa J.; Nickias, Peter; Yancey, David F.
Journal:: Advanced functional materials
Issue:: Volume 29:Number 11(2019)
Page Start:: n/a
Record Type:: Journal Article
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Authors:: Specht, Petra; Kirste, Ronny; Sitar, Zlatko; Anderson, Travis; Koehler, Andrew; Kisielowski, Christian
Journal:: Microscopy and microanalysis
Issue:: Volume 26:(2020)Supplement 2
Page Start:: 3064
Record Type:: Journal Article
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Authors:: Kisielowski, Christian; Specht, Petra; Rozeveld, Steve; Freitag, Bert; Kieft, Erik R.; Kang, Joo; Fielitz, Alyssa J.; Fielitz, Thomas R.; van Dyck, Dirk; Yancey, David F.
Journal:: Advanced functional materials
Issue:: Volume 32:Number 27(2022)
Page Start:: n/a
Record Type:: Journal Article
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Authors:: Kisielowski, Christian; Specht, Petra; Rozeveld, Steven J.; Kang, Joo; Fielitz, Alyssa J.; Barton, David; Salazar, Anthony C.; Dubon, Oscar D.; Van Dyck, Dirk; Yancey, David F.
Journal:: Microscopy and microanalysis
Issue:: Volume 27:Number 6(2021)
Page Start:: 1420
Record Type:: Journal Article
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Authors:: Specht, Petra; Kisielowski, Christian
Journal:: Materials science in semiconductor processing
Issue:: Volume 65(2017)
Page Start:: 24
Record Type:: Journal Article
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Authors:: Kisielowski, Christian; Specht, Petra; Yancey, David; Rozeveld, Steve; Kang, Joo; McKenna, Alyssa; Barton, David
Journal:: Microscopy and microanalysis
Issue:: Volume 26:(2020)Supplement 2
Page Start:: 2874
Record Type:: Journal Article
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗

Authors:: Kisielowski, Christian; Specht, Petra; Freitag, Bert; Kieft, Erik R.; Verhoeven, Wouter; van Rens, Jasper F.M.; Mutsaers, Peter; Luiten, Jom; Rozeveld, Steve; Kang, Joo; McKenna, Alyssa J.; Nickias, Peter; Yancey, David F.
Journal:: Microscopy and microanalysis
Issue:: Volume 25:(2022)Supplement 2
Page Start:: 1652
Record Type:: Journal Article
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗

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