1. A Deep Level Transient Spectroscopy Study of Hole Traps in GexSe1−x-based Layers for Ovonic Threshold Switching Selectors. (1st May 2020) Authors: Hsu, P.-C.; Simoen, E.; Lin, D.; Stesmans, A.; Goux, L.; Delhougne, R.; Carolan, P.; Bender, H.; Kar, G. S. Journal: ECS journal of solid state science and technology Issue: Volume 9:Number 4(2020) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. A DLTS Perspective on Electrically Active Defects in Plated Crystalline Silicon n+p Solar Cells. (1st January 2019) Authors: Simoen, E.; Dang, C.; Labie, R.; Poortmans, J. Journal: ECS journal of solid state science and technology Issue: Volume 8:Number 11(2019) Page Start: P693 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
3. A DLTS Perspective on Electrically Active Defects in Plated Crystalline Silicon n+p Solar Cells. (1st November 2019) Authors: Simoen, E.; Dang, C.; Labie, R.; Poortmans, J. Journal: ECS journal of solid state science and technology Issue: Volume 8:Number 11(2019) Page Start: P693 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
4. Carbon-Related Defects in Si:C/Silicon Heterostructures Assessed by Deep-Level Transient Spectroscopy. (1st January 2017) Authors: Simoen, E.; Dhayalan, S. K.; Hikavyy, A.; Loo, R.; Rosseel, E.; Vrielinck, H.; Lauwaert, J. Journal: ECS journal of solid state science and technology Issue: Volume 6:Number 5(2017) Page Start: P284 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
5. Carbon-Related Defects in Si:C/Silicon Heterostructures Assessed by Deep-Level Transient Spectroscopy. (4th April 2017) Authors: Simoen, E.; Dhayalan, S. K.; Hikavyy, A.; Loo, R.; Rosseel, E.; Vrielinck, H.; Lauwaert, J. Journal: ECS journal of solid state science and technology Issue: Volume 6:Number 5(2017) Page Start: P284 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
6. Comparative Study of Current Transients in HPHT and CVD Diamond Capacitor-Sensors. (13th January 2016) Authors: Gaubas, E.; Ceponis, T.; Meskauskaite, D.; Simoen, E. Journal: ECS journal of solid state science and technology Issue: Volume 5:Number 4(2016) Page Start: P3101 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
7. Comparative Study of Current Transients in HPHT and CVD Diamond Capacitor-Sensors. (1st January 2016) Authors: Gaubas, E.; Ceponis, T.; Meskauskaite, D.; Simoen, E. Journal: ECS journal of solid state science and technology Issue: Volume 5:Number 4(2016) Page Start: P3101 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
8. Comparison between experimental and simulated strain profiles in Ge channels with embedded source/drain stressors. Issue 11 (25th July 2014) Authors: Bühler, R.; Eneman, G.; Favia, P.; Bender, H.; Vincent, B.; Hikavyy, A.; Loo, R.; Martino, J. A.; Claeys, C.; Simoen, E.; Collaert, N.; Thean, A.; Pizzini, Sergio; Kissinger, Gudrun Journal: Physica status solidi Issue: Volume 11:Issue 11/12(2014) Page Start: 1578 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
9. DC and low a frequency noise analysis of p channel gate all around vertically stacked silicon nanosheets. (August 2022) Authors: Cretu, B.; Veloso, A.; Simoen, E. Journal: Solid-state electronics Issue: Volume 194(2022) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
10. Deep Level Assessment of n-Type Si/SiO2 Metal-Oxide-Semiconductor Capacitors with Embedded Ge Quantum Dots. (1st January 2018) Authors: Aouassa, M.; Vrielinck, H.; Simoen, E. Journal: ECS journal of solid state science and technology Issue: Volume 7:Number 2(2018) Page Start: P24 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗