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4. Density functional study for crystalline structures and electronic properties of Si1−xSnx binary alloys. (14th July 2016)

6. Erratum: "Effect of carbon in Si oxide interlayers of the Al2O3/4H-SiC structure on interfacial reaction by oxygen radical treatment" [Jpn. J. Appl. Phys. 58 SBBD05 (2019)]. (27th March 2019)

9. Growth of ultrahigh-Sn-content Ge1−xSnx epitaxial layer and its impact on controlling Schottky barrier height of metal/Ge contact. (29th March 2016)