1. Investigation into trapping modes and threshold instabilities of state-of-art commercial GaN HEMTs. (September 2019) Authors: Mukherjee, K.; De Santi, C.; Rzin, M.; Gao, Z.; Meneghesso, G.; Meneghini, M.; Zanoni, E. Journal: Microelectronics and reliability Issue: Volume 100/101(2019) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. Investigation of the dynamic on-state resistance of AlGaN/GaN HEMTs. Issue 9 (August 2015) Authors: Rzin, M.; Labat, N.; Malbert, N.; Curutchet, A.; Brunel, L.; Lambert, B. Journal: Microelectronics and reliability Issue: Volume 55:Issue 9/10(2015) Page Start: 1672 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
3. Linearity and robustness evaluation of 150-nm AlN/GaN HEMTs. (September 2019) Authors: Rzin, M.; Meneghini, M.; Rampazzo, F.; Zhan, V. Gao; De Santi, C.; Kabouche, R.; Zegaoui, M.; Medjdoub, F.; Meneghesso, G.; Zanoni, E. Journal: Microelectronics and reliability Issue: Volume 100/101(2019) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
4. On-wafer RF stress and trapping kinetics of Fe-doped AlGaN/GaN HEMTs. (September 2018) Authors: Rzin, M.; Chini, A.; De Santi, C.; Meneghini, M.; Hugger, A.; Hollmer, M.; Stieglauer, H.; Madel, M.; Splettstößer, J.; Sommer, D.; Grünenpütt, J.; Beilenhoff, K.; Blanck, H.; Chen, J.-T.; Kordina, O.; Meneghesso, G.; Zanoni, E. Journal: Microelectronics and reliability Issue: Volume 88/90(2018) Page Start: 397 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
5. Reliability comparison of AlGaN/GaN HEMTs with different carbon doping concentration. (September 2019) Authors: Gao, Z.; Meneghini, M.; Rampazzo, F.; Rzin, M.; De Santi, C.; Meneghesso, G.; Zanoni, E. Journal: Microelectronics and reliability Issue: Volume 100/101(2019) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗