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Author/Creator Rzin, M.

4. On-wafer RF stress and trapping kinetics of Fe-doped AlGaN/GaN HEMTs. (September 2018)

Authors:
Rzin, M.; Chini, A.; De Santi, C.; Meneghini, M.; Hugger, A.; Hollmer, M.; Stieglauer, H.; Madel, M.; Splettstößer, J.; Sommer, D.; Grünenpütt, J.; Beilenhoff, K.; Blanck, H.; Chen, J.-T.; Kordina, O.; Meneghesso, G.; Zanoni, E.
Journal:
Microelectronics and reliability
Issue:
Volume 88/90(2018)
Page Start:
397
Record Type:
Journal Article
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